16.06.2023

New publication

New publication on the effects of spaceflight on EEG power and functional connectivity in the alpha band

Changes in DMN alpha band power (eyes closed) between flight conditions: (a) Statistical comparison between conditions. (b) Brain figures represent the DMN areas with higher statistical power changes in the alpha band comparing DMN ROIs between in-flight versus pre-flight conditions.

Spaceflights expose crew members to factors that can negatively affect their health and performance. Understanding this environmental impact on human physiology is essential to ensure personnel well-being and mission success.

A recently published study explores the effect of spaceflight on brain networks through analysis of the Default Mode Network (DMN)’s alpha frequency band power and functional connectivity (FC). Five astronauts’ resting state EEGs under three conditions were analyzed (pre-flight, in-flight, and post-flight). DMN’s alpha band power and FC were computed using eLORETA and phaselocking value. Eyes-opened (EO) and eyes-closed (EC) conditions were differentiated.

We found a DMN alpha band power reduction during in-flight (EC: p < 0.001; EO: p < 0.05) and post-flight (EC: p < 0.001; EO: p < 0.01) when compared to pre-flight condition. FC strength decreased during in-flight (EC: p < 0.01; EO: p < 0.01) and post-flight (EC: ns; EO: p < 0.01) compared to pre-flight condition. The DMN alpha band power and FC strength reduction persisted until 20 days after landing.

Consequently, spaceflight caused electrocerebral alterations that persisted after return to earth. Periodic assessment by EEG-derived DMN analysis has the potential to become a neurophysiologic marker of cerebral functional integrity during exploration missions to space.

Pusil, S.; Zegarra-Valdivia, J.; Cuesta, P.; Laohathai, C.; Cebolla, A.M.; Haueisen, J.; Fiedler, P.; Funke, M.; Maestú, F.; Cheron, G.:

Effects of spaceflight on the EEG alpha power and functional connectivity.
(2023)
Nature Scientific Reports 13:9489.

https://doi.org/10.1038/s41598-023-34744-1

Contact:    Jun.-Prof. Dr.-Ing. Patrique Fiedler