Hotovy, Ivan; Rehacek, Vlastimil; Siciliano, Pietro; Capone, Simonetta; Spieß, Lothar
NiO thin films for gas sensing applications. - In: Sensors for Enviromental Control, (2003), S. 58-63
NiO thin films for gas sensing applications. - In: Sensors for Enviromental Control, (2003), S. 58-63
Spieß, Lothar; Gubisch, Maik; Romanus, Henry; Breiter, Manuela; Müller, Ch.; Cimalla, Volker; Ecke, Gernot; Liu, Yonghe; Knedlik, Christian
Tungsten carbide layers for nanomeasuring systems. - In: Proceedings, (2003), S. 165-170
Tungsten carbide layers for nanomeasuring systems. - In: Proceedings, (2003), S. 165-170
Cui, S.; Scharff, Peter; Siegmund, Carmen; Spieß, Lothar; Romanus, Henry; Schawohl, Jens; Risch, Katrin; Schneider, Doreen; Klötzer, Susann
Preparation of multiwalled carbon nanotubes by DC arc discharge under a nitrogen atmosphere. - In: Carbon, ISSN 1873-3891, Bd. 41 (2003), 8, S. 1648-1651
http://dx.doi.org/10.1016/S0008-6223(03)00083-6
Preparation of multiwalled carbon nanotubes by DC arc discharge under a nitrogen atmosphere. - In: Carbon, ISSN 1873-3891, Bd. 41 (2003), 8, S. 1648-1651
http://dx.doi.org/10.1016/S0008-6223(03)00083-6
Hotovy, Ivan; Huran, Jozef; Spieß, Lothar; Liday, Jozef; Sitter, Helmut; Hascik, S.
The influence of process parameters and annealing temperature on the physical properties of sputtered NiO thin films. - In: Vacuum, ISSN 0042-207X, Bd. 69 (2003), 1/3, S. 237-242
http://dx.doi.org/10.1016/S0042-207X(02)00338-X
The influence of process parameters and annealing temperature on the physical properties of sputtered NiO thin films. - In: Vacuum, ISSN 0042-207X, Bd. 69 (2003), 1/3, S. 237-242
http://dx.doi.org/10.1016/S0042-207X(02)00338-X
Rehacek, Vlastimil; Novotny, Ivan; Tvarozek, Vladimir; Vavrinsky, Erik; Breternitz, Volkmar; Knedlik, Christian; Spieß, Lothar
Thin-film gold, palladium and indium tin oxide microelectrodes modified by mercury. - In: Proceedings and our portrait, (2003), insges. 16 S.
Thin-film gold, palladium and indium tin oxide microelectrodes modified by mercury. - In: Proceedings and our portrait, (2003), insges. 16 S.
Ibrahim, Maher al-; Sensfuss, Steffi; Roth, Hans-Klaus; Zhokhavets, Uladzimir; Gobsch, Gerhard; Ayuk Mbi Egbe, Daniel; Klemm, Elisabeth; Knedlik, Christian
Optical and electrochemical measurements looking for new donor-acceptor pairs and their application in polymer solar cells. - In: Proceedings and our portrait, (2003), insges. 2 S.
Optical and electrochemical measurements looking for new donor-acceptor pairs and their application in polymer solar cells. - In: Proceedings and our portrait, (2003), insges. 2 S.
Jakubec, Andrej; Tvarozek, Vladimir; Novotny, I.; Rehacek, Vlastimil; Breternitz, Volkmar; Knedlik, Christian; Spieß, Lothar
Characterization of Indium-Tin-Oxide thin film microelectrodes for biomedical use. - In: Materials science and engineering technology, ISSN 1521-4052, Bd. 34 (2003), 7, S. 662-665
http://dx.doi.org/10.1002/mawe.200390132
Characterization of Indium-Tin-Oxide thin film microelectrodes for biomedical use. - In: Materials science and engineering technology, ISSN 1521-4052, Bd. 34 (2003), 7, S. 662-665
http://dx.doi.org/10.1002/mawe.200390132
Gräbner, Frank; Teichert, Gerd; Knedlik, Christian; Hildenbrandt, S.; Romanus, Henry; Hungsberg, A.; Koledintseva, M.
Simulation of layer-sequence of Ni-Zn ferrite thin films and multilayers for EMC applications > 1000 MHz :
Untersuchung zur Schichtfolge eines Multilayerschichtsystems NiZn Ferrit/Si bzw. SiO 2 für Höchstfrequenzleiterplatten im Frequenzbereich größer 1000 MHz. - In: Materials science and engineering technology, ISSN 1521-4052, Bd. 34 (2003), 7, S. 603-607
http://dx.doi.org/10.1002/mawe.200390121
Simulation of layer-sequence of Ni-Zn ferrite thin films and multilayers for EMC applications > 1000 MHz :
Untersuchung zur Schichtfolge eines Multilayerschichtsystems NiZn Ferrit/Si bzw. SiO 2 für Höchstfrequenzleiterplatten im Frequenzbereich größer 1000 MHz. - In: Materials science and engineering technology, ISSN 1521-4052, Bd. 34 (2003), 7, S. 603-607
http://dx.doi.org/10.1002/mawe.200390121
Spieß, Lothar; Knedlik, Christian
Nutzung von Werkstoffstrukturgrößen als Messnormale. - In: Materials science and engineering technology, ISSN 1521-4052, Bd. 34 (2003), 7, S. 648-653
http://dx.doi.org/10.1002/mawe.200390130
Nutzung von Werkstoffstrukturgrößen als Messnormale. - In: Materials science and engineering technology, ISSN 1521-4052, Bd. 34 (2003), 7, S. 648-653
http://dx.doi.org/10.1002/mawe.200390130
Cimalla, Volker; Pezoldt, Jörg; Ecke, Gernot; Kosiba, Rastislav; Ambacher, Oliver; Spieß, Lothar; Teichert, Gerd; Lu, Hai; Schaff, William J.
Growth of cubic InN on r-plane sapphire. - In: Applied physics letters, ISSN 1077-3118, Bd. 83 (2003), 17, S. 3468-3470
http://dx.doi.org/10.1063/1.1622985
Growth of cubic InN on r-plane sapphire. - In: Applied physics letters, ISSN 1077-3118, Bd. 83 (2003), 17, S. 3468-3470
http://dx.doi.org/10.1063/1.1622985