Carpene, Ettore; Höche, Daniel; Schaaf, Peter
Fundamentals of laser-material interactions. - In: Laser processing of materials, (2010), S. 21-44
Fundamentals of laser-material interactions. - In: Laser processing of materials, (2010), S. 21-44
Kups, Thomas;
Crystalline calibration standard for NPM : the use of well known lattice plane distances. - In: Imaging & microscopy, ISSN 1439-4243, Bd. 12 (2010), 2, S. 38-39
Crystalline calibration standard for NPM : the use of well known lattice plane distances. - In: Imaging & microscopy, ISSN 1439-4243, Bd. 12 (2010), 2, S. 38-39
Kosc, Ivan; Hotovy, Ivan; Kompitsas, Michael; Grieseler, Rolf; Wilke, Marcus; Rehacek, Vlastimil; Predanocy, Martin; Kups, Thomas; Spieß, Lothar
The compound oxides based on TiO2 and NiO thin films for low temperature gas detection. - In: 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), 2010, ISBN 978-1-4244-8572-7, (2010), S. 337-340
http://dx.doi.org/10.1109/ASDAM.2010.5666355
The compound oxides based on TiO2 and NiO thin films for low temperature gas detection. - In: 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), 2010, ISBN 978-1-4244-8572-7, (2010), S. 337-340
http://dx.doi.org/10.1109/ASDAM.2010.5666355
Predanocy, Martin; Fasaki, I.; Wilke, Marcus; Hotovy, Ivan; Kosc, Ivan; Spieß, Lothar
Study of optical and electrical properties of sputtered indium oxide films. - In: 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), 2010, ISBN 978-1-4244-8572-7, (2010), S. 297-300
http://dx.doi.org/10.1109/ASDAM.2010.5667003
Study of optical and electrical properties of sputtered indium oxide films. - In: 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), 2010, ISBN 978-1-4244-8572-7, (2010), S. 297-300
http://dx.doi.org/10.1109/ASDAM.2010.5667003
Novotný, Ivan; Kotorová, D.; Flickyngerová, Sona; Tvarožek, Vladimir; Spiess, Lothar; Schaaf, Peter; Netrvalová, Marie; Šutta, Pavol
Effect of substrate temperature on oblique-angle sputtered ZnO:Ga thin films. - In: 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), 2010, ISBN 978-1-4244-8572-7, (2010), S. 73-76
http://dx.doi.org/10.1109/ASDAM.2010.5666346
Effect of substrate temperature on oblique-angle sputtered ZnO:Ga thin films. - In: 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), 2010, ISBN 978-1-4244-8572-7, (2010), S. 73-76
http://dx.doi.org/10.1109/ASDAM.2010.5666346
Wilden, Johannes; Drescher, Viktor E.; Schaaf, Peter; Günschmann, Sabine
Composite coatings with drag reduction and self-cleaning properties. - In: Conference proceedings, (2010), insges. 5 S.
Composite coatings with drag reduction and self-cleaning properties. - In: Conference proceedings, (2010), insges. 5 S.
Amran, Yogev; Katsman, Alexander; Schaaf, Peter; Bamberger, Menachem
Influence of copper addition and temperature on the kinetics of austempering in ductile iron. - In: Metallurgical and materials transactions. Process metallurgy and materials processing science. - New York, NY : Springer Sciences & Business Media, 1975- , ISSN: 1543-1916 , ZDB-ID: 2037524-4, ISSN 1543-1916, Bd. 41 (2010), 5, S. 1052-1058
http://dx.doi.org/10.1007/s11663-010-9388-y
Influence of copper addition and temperature on the kinetics of austempering in ductile iron. - In: Metallurgical and materials transactions. Process metallurgy and materials processing science. - New York, NY : Springer Sciences & Business Media, 1975- , ISSN: 1543-1916 , ZDB-ID: 2037524-4, ISSN 1543-1916, Bd. 41 (2010), 5, S. 1052-1058
http://dx.doi.org/10.1007/s11663-010-9388-y
Tvarožek, Vladimír; Novotny, Ivan; Sutta, Pavol; Netrvalova, Marie; Flickyngerova, Sona; Spieß , Lothar; Schaaf, Peter
Sputtering of ZnO:Ga thin films with the inclined crystalic texture. - In: 2010 27th International Conference on Microelectronics proceedings (MIEL), ISBN 978-1-4244-7200-0, (2010), S. 177-180
http://dx.doi.org/10.1109/MIEL.2010.5490506
Sputtering of ZnO:Ga thin films with the inclined crystalic texture. - In: 2010 27th International Conference on Microelectronics proceedings (MIEL), ISBN 978-1-4244-7200-0, (2010), S. 177-180
http://dx.doi.org/10.1109/MIEL.2010.5490506
Hopfeld, Marcus; Wilden, Johannes; Drescher, Viktor E.; Schaaf, Peter
In-situ synthesis of Y2W3O12 within a Co-based superalloy powder mixture. - In: International journal of materials research, ISSN 2195-8556, Bd. 101 (2010), 8, S. 1042-1045
Im Titel sind "2", "3" und "12" tiefgestellt
https://doi.org/10.3139/146.110374
In-situ synthesis of Y2W3O12 within a Co-based superalloy powder mixture. - In: International journal of materials research, ISSN 2195-8556, Bd. 101 (2010), 8, S. 1042-1045
Im Titel sind "2", "3" und "12" tiefgestellt
https://doi.org/10.3139/146.110374