Journal articles from 2018

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Cusenza, Salvatore; Jürgens, Daniel; Uhrmacher, Michael; Schaaf, Peter
Nitrided amorphous stainless steel coatings deposited by reactive magnetron sputtering from an austenitic stainless steel target. - In: Advanced engineering materials, ISSN 1527-2648, Bd. 11 (2009), 1/2, S. 17-25

Stainless steel films were reactively magnetron sputtered in argon/nitrogen gas flow onto oxidized silicon wafers using austenitic AISI 316 stainless-steel targets. The deposited films of about 300 nm thickness were characterized by conversion electron Mössbauer spectroscopy, magneto-optical Kerreffect, X-ray diffraction, Rutherford backscattering spectrometry, and resonant nuclear reaction analysis. These complementary methods were used for a detailed examination of the nitriding effects for the sputtered stainless-steel films. The formation of an amorphous and soft ferromagnetic phase in a wide range of the processing parameters was found. Further, the influence of postvacuum-annealing was examined by perturbed angular correlation to achieve a comprehensive understanding of the nitriding process and phase formation. The amorphous phase is not very stable and crystallization can be observed at 973 K.



https://doi.org/10.1002/adem.200800228
Cusenza, Salvatore; Schaaf, Peter
Amorphous stainless steel coatings prepared by reactive magnetron-sputtering from austenitic stainless steel targets. - In: Applied physics, ISSN 1432-0630, Bd. 94 (2009), 1, S. 139-154

Stainless steel films were reactively magnetron sputtered in argon/methane gas flow onto oxidized silicon wafers using austenitic stainless-steel targets. The deposited films of about 200 nm thickness were characterized by conversion electron Mössbauer spectroscopy, magnetooptical Kerr-effect, X-ray diffraction, scanning electron microscopy, Rutherford backscattering spectrometry, atomic force microscopy, corrosion resistance tests, and Raman spectroscopy. These complementary methods were used for a detailed examination of the carburization effects in the sputtered stainless-steel films. The formation of an amorphous and soft ferromagnetic phase in a wide range of the processing parameters was found. Further, the influence of the substrate temperature and of post vacuum-annealing were examined to achieve a comprehensive understanding of the carburization process and phase formation.



http://dx.doi.org/10.1007/s00339-008-4685-x
Spieß, Lothar
Moderne Röntgenbeugung : Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker
2., überarb. und erw. Aufl.. - Wiesbaden : Vieweg + Teubner, 2009. - XIV, 564 S.. - (Studium) ISBN 978-3-8351-0166-1
Literaturverz. S. [543] - 554

Wilke, Marcus; Teichert, Gerd;
Vergleichende Untersuchungen zur Charakterisierung der Verbindungsschicht beim Nitrocarburieren. - In: Fortschritte in der Metallographie, (2008), S. 209-304

Hotovy, Juraj; Kups, Thomas; Kovac, Jaroslav; Spieß, Lothar; Novotny, Ivan; Kovac, Jaroslav
Growth and characterization of ZnO thin films using XRD and AFM. - In: Prospects in mechanical engineering, (2008), insges. 10 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=18044
Hotovy, Ivan; Predanocy, Martin; Hotovy, Juraj; Kups, Thomas; Spieß, Lothar; Wang, Chunyu; Rehacek, Vlastimil
Growth and characterization of indium oxide films for ozone detection. - In: Prospects in mechanical engineering, (2008), insges. 11 S.

http://www.db-thueringen.de/servlets/DocumentServlet?id=18741
Kups, Thomas; Knote, Andreas; Spieß, Lothar
SEM and TEM investigations of electrophoretical deposited Si3N4 and SiC particles in siloxane of steel substrate. - In: Materials science, ISBN 978-3-540-85225-4, (2008), S. 695-696

Kups, Thomas; Kremin, Christoph; Hoffmann, Martin; Spieß, Lothar
Surface investigation of SU-8 by atomic force and scanning electron microscopy. - In: Materials science, ISBN 978-3-540-85225-4, (2008), S. 693-694

Wilden, Johannes; Jahn, Simon; Drescher, Viktor; Schaaf, Peter
High-temperature-functionalization of surfaces: drag reduction and self-cleaning. - In: Thermal spray crossing borders, ISBN 978-3-87155-979-2, (2008), insges. 6 S.

Kups, Thomas; Voelskow, Matthias; Skorupa, Wolfgang; Soueidan, M.; Ferro, G.; Pezoldt, Jörg
Lattice location determination of Ge in SiC by ALCHEMI. - In: Microscopy of semiconducting materials 2007, (2008), S. 353-358