Mäuselein, Sascha; Mack, Oliver; Schwartz, Roman; Jäger, Gerd
Investigations of load cells made of singlecrystalline silicon with sputrered-on strain gauges. - In: IMEKO TC3 & TC16 & TC22 International Conference, (2007), insges. 12 S.
Investigations of load cells made of singlecrystalline silicon with sputrered-on strain gauges. - In: IMEKO TC3 & TC16 & TC22 International Conference, (2007), insges. 12 S.
Fröhlich, Thomas; Fehling, Thomas; Gatzmeier, Benno; Osang, S.; Heydenbluth, Detlef
Mass dissemination using a fully automated mass comparator robot system. - In: IMEKO TC3 & TC16 & TC22 International Conference, (2007), insges. 8 S.
Mass dissemination using a fully automated mass comparator robot system. - In: IMEKO TC3 & TC16 & TC22 International Conference, (2007), insges. 8 S.
Fehling, Thomas; Fröhlich, Thomas; Heydenbluth, Detlef
Design and performance of the new Sartorius robot-system. - In: IMEKO TC3 & TC16 & TC22 International Conference, (2007), insges. 8 S.
Design and performance of the new Sartorius robot-system. - In: IMEKO TC3 & TC16 & TC22 International Conference, (2007), insges. 8 S.
Dorozhovets, Nataliya; Hausotte, Tino; Jäger, Gerd; Manske, Eberhard
Application of the metrological scanning probe microscope for high-precision, long-range, traceable measurements. - In: Optical measurement systems for industrial inspection V, 2007, 661624, insges. 7 S.
Application of the metrological scanning probe microscope for high-precision, long-range, traceable measurements. - In: Optical measurement systems for industrial inspection V, 2007, 661624, insges. 7 S.
Jäger, Gerd; Manske, Eberhard; Hausotte, Tino; Mastylo, Rostyslav; Dorozhovets, Nataliya; Hofmann, Norbert
Precision mechatronics based on high-precision measuring and positioning systems and machines. - In: Optical measurement systems for industrial inspection V, 2007, 661621, insges. 10 S.
Precision mechatronics based on high-precision measuring and positioning systems and machines. - In: Optical measurement systems for industrial inspection V, 2007, 661621, insges. 10 S.
Schalles, Marc; Bernhard, Frank
Triple-fixed-point blackbody for the calibration of radiation thermometers. - In: International journal of thermophysics, ISSN 1572-9567, Bd. 28 (2007), 6, S. 2049-2058
http://dx.doi.org/10.1007/s10765-007-0277-9
Triple-fixed-point blackbody for the calibration of radiation thermometers. - In: International journal of thermophysics, ISSN 1572-9567, Bd. 28 (2007), 6, S. 2049-2058
A new triple-fixed-point blackbody containing the fixed-point materials aluminum (freezing point 660.323&ayn;C), zinc (FP 419.527&ayn;C), and tin (FP 231.928&ayn;C) in one device has been developed at the Ilmenau University of Technology. It enables calibration of a radiation thermometer with direct reference to the ITS-90 at three fixed points after a single adjustment of the calibration object. The setup significantly reduces the technical effort and the time for the calibration procedure. Measurements of the phase-transition temperature and the time-dependent blackbody temperature made with a transfer radiation thermometer, the Linearpyrometer LP5 of the IKE Stuttgart, are presented in the article.
http://dx.doi.org/10.1007/s10765-007-0277-9
Jäger, Gerd; Manske, Eberhard; Hausotte, Tino
Precision mechatronics, nanometrology, nanomeasuring and nanopositioning engineering. - In: 10th CIRP Conference on Computer Aided Tolerancing, Specification and Verification for Assemblies, ISBN 978-3-8322-6036-1, (2007), insges. 8 S.
Precision mechatronics, nanometrology, nanomeasuring and nanopositioning engineering. - In: 10th CIRP Conference on Computer Aided Tolerancing, Specification and Verification for Assemblies, ISBN 978-3-8322-6036-1, (2007), insges. 8 S.
Jäger, Gerd; Manske, Eberhard; Hausotte, Tino; Mastylo, Rostyslav; Dorozhovets, Natalja; Hofmann, Norbert
Traceable nanometrology realized by means of nanopositioning and nanomeasuring machine. - In: Proceedings of ISMTII 2007, (2007), S. 433-436
Traceable nanometrology realized by means of nanopositioning and nanomeasuring machine. - In: Proceedings of ISMTII 2007, (2007), S. 433-436
Kapusi, Daniel; Machleidt, Torsten; Franke, Karl-Heinz; Manske, Eberhard; Jahn, Rainer
Measuring large areas by white light interferometry at the nanopositioning and nanomeasuring machine (NPMM). - In: , (2007), S. 257-262
Seitenzählung nicht identisch mit Druckausg., Inhalt identisch mit Druckausg. S. 251-256
http://www.db-thueringen.de/servlets/DocumentServlet?id=8885
Measuring large areas by white light interferometry at the nanopositioning and nanomeasuring machine (NPMM). - In: , (2007), S. 257-262
Seitenzählung nicht identisch mit Druckausg., Inhalt identisch mit Druckausg. S. 251-256
http://www.db-thueringen.de/servlets/DocumentServlet?id=8885
Fan, Kuang-Chao; Lai, Zi-Fa; Wu, Peitsung; Chen, Yung-Chang; Chen, Yejin; Jäger, Gerd
A displacement spindle in a micro/nano level. - In: Measurement science and technology, ISSN 1361-6501, Bd. 18 (2007), 6, S. 1710-1717
http://dx.doi.org/10.1088/0957-0233/18/6/S07
A displacement spindle in a micro/nano level. - In: Measurement science and technology, ISSN 1361-6501, Bd. 18 (2007), 6, S. 1710-1717
http://dx.doi.org/10.1088/0957-0233/18/6/S07