Dorozhovets, Nataliya; Hausotte, Tino; Manske, Eberhard; Jäger, Gerd
Metrologisches Rasterkraftmikroskop. - In: Maschinenbau von Makro bis Nano, 2005, [01.13], insges. 3 S.
http://www.db-thueringen.de/servlets/DocumentServlet?id=16758
Metrologisches Rasterkraftmikroskop. - In: Maschinenbau von Makro bis Nano, 2005, [01.13], insges. 3 S.
http://www.db-thueringen.de/servlets/DocumentServlet?id=16758
Jäger, Gerd; Hausotte, Tino; Manske, Eberhard; Büchner, Hans-Joachim; Mastylo, Rostyslav; Dorozhovets, Natalja; Füßl, Roland; Grünwald, Rainer
Progress on the wide scale nanopositioning and nanomeasuring machine by integration of different nanoprobes. - In: New frontiers in mechatronics technology, (2005), insges. 4 S.
Progress on the wide scale nanopositioning and nanomeasuring machine by integration of different nanoprobes. - In: New frontiers in mechatronics technology, (2005), insges. 4 S.
Fehling, Thomas; Fröhlich, Thomas; Heydenbluth, Detlef
The new Sartorius 1kg-prototype balance for high precision mass determination. - In: Unrefereed full papers, (2005), insges. 6 S.
The new Sartorius 1kg-prototype balance for high precision mass determination. - In: Unrefereed full papers, (2005), insges. 6 S.
Fröhlich, Thomas; Fehling, Thomas; Gatzemeier, Benno; Heydenbluth, Detlef
Sartorius susceptometer for precise measurement of susceptibility and magnetization of weights. - In: Unrefereed full papers, (2005), insges. 6 S.
Sartorius susceptometer for precise measurement of susceptibility and magnetization of weights. - In: Unrefereed full papers, (2005), insges. 6 S.
Mastylo, Rostyslav; Dontsov, Denis; Manske, Eberhard; Jäger, Gerd
A focus sensor for an application in a nanopositioning and nanomeasuring machine. - In: Optical measurement systems for industrial inspection IV, (2005), S. 238-244
A focus sensor for an application in a nanopositioning and nanomeasuring machine. - In: Optical measurement systems for industrial inspection IV, (2005), S. 238-244
Hilbrunner, Falko; Blumröder, Götz; Fröhlich, Thomas
Mathematical moisture compensation of precision measuring instruments. - In: SENSOR 2005, (2005), S. 473-477
Mathematical moisture compensation of precision measuring instruments. - In: SENSOR 2005, (2005), S. 473-477
Jäger, Gerd; Manske, Eberhard; Hausotte, Tino; Mastylo, Rostyslav; Büchner, Hans-Joachim; Grünwald, Rainer; Füßl, Roland
Integration of probe systems in a nanopositioning and nanomeasuring machine. - In: Eighth International Symposium on Laser Metrology: Macro-, Micro-, and Nano-Technologies Applied in Science, Engineering, and Industry, (2005), S. 168-172
Integration of probe systems in a nanopositioning and nanomeasuring machine. - In: Eighth International Symposium on Laser Metrology: Macro-, Micro-, and Nano-Technologies Applied in Science, Engineering, and Industry, (2005), S. 168-172
Hausotte, Tino; Jäger, Gerd; Manske, Eberhard; Hofmann, Norbert; Dorozhovets, Natalja
Application of a positioning and measuring machine for metrological long-range scanning force microscopy. - In: Advanced characterization techniques for optics, semiconductors, and nanotechnologies II, (2005), S. 587802, insges. 12 S.
Application of a positioning and measuring machine for metrological long-range scanning force microscopy. - In: Advanced characterization techniques for optics, semiconductors, and nanotechnologies II, (2005), S. 587802, insges. 12 S.
Manske, Eberhard; Hausotte, Tino; Mastylo, Rostyslav; Hofmann, Norbert; Jäger, Gerd
Nanopositioning and nanomeasuring machine for high accuracy measuring procedures of small features in large areas. - In: Optical fabrication, testing, and metrology II, (2005), S. 596509, insges. 11 S.
Nanopositioning and nanomeasuring machine for high accuracy measuring procedures of small features in large areas. - In: Optical fabrication, testing, and metrology II, (2005), S. 596509, insges. 11 S.
Jäger, Gerd; Hausotte, Tino; Manske, Eberhard; Büchner, Hans-Joachim; Mastylo, Rostyslav; Dorozhovets, Natalja; Füßl, Roland; Grünwald, Rainer
Progress on the wide scale nano-positioning- and nanomeasuring machine by integration of optical-nanoprobes. - In: Fringe 2005, (2005), S. 291-298
Progress on the wide scale nano-positioning- and nanomeasuring machine by integration of optical-nanoprobes. - In: Fringe 2005, (2005), S. 291-298