Boccaccini, Aldo R.; Schawohl, Jens; Kern, Heinrich; Schunck, Björn; Rincon, Jesús Ma.; Romero, Maximina
Sintered glass ceramics from municipal incinerator fly ash. - In: Glass technology, ISSN 0017-1050, Bd. 41 (2000), 3, S. 99-105
Sintered glass ceramics from municipal incinerator fly ash. - In: Glass technology, ISSN 0017-1050, Bd. 41 (2000), 3, S. 99-105
Teichert, Gerd; Schleicher, Larissa; Knedlik, Christian; Voelskov, Matthias; Skorupa, Wolfgang; Yankov, Rossen A.; Pezoldt, Jörg
Thermal wave analysis: a tool for non-invasive testing in ion beam synthesis of wide bandgap materials. - In: Microstructural processes in irradiated materials, (1999), S. 103-108
Thermal wave analysis: a tool for non-invasive testing in ion beam synthesis of wide bandgap materials. - In: Microstructural processes in irradiated materials, (1999), S. 103-108
Erler, Frank; Romanus, Henry; Lindner, Jörg K. N.; Spieß, Lothar
High temperature stable WSi2-contacts on p-6H-silicon carbide. - In: Wide-bandgap semiconductors for high-power, high-frequency and high-temperature applications - 1999, (1999), S. 111-116
High temperature stable WSi2-contacts on p-6H-silicon carbide. - In: Wide-bandgap semiconductors for high-power, high-frequency and high-temperature applications - 1999, (1999), S. 111-116
Romanus, Henry; Cimalla, Volker; Ahmed, Syed Imad-Uddin; Schäfer, Jürgen A.; Ecke, Gernot; Avci, R.; Spieß, Lothar
Preparation of conductive tungsten carbide layers for SiC high temperature applications. - In: Wide-bandgap semiconductors for high-power, high-frequency and high-temperature applications - 1999, (1999), S. 99-104
Preparation of conductive tungsten carbide layers for SiC high temperature applications. - In: Wide-bandgap semiconductors for high-power, high-frequency and high-temperature applications - 1999, (1999), S. 99-104
Knedlik, Christian; Breternitz, Volker; Tippmann, Herbert; Scheffner, W.; Gutermuth, U.
Alterung von Zinn-Blei-Belotungen auf Bronze Halbzeug. - In: Werkstoffe für die Informationstechnik, (1999), S. 71-76
Alterung von Zinn-Blei-Belotungen auf Bronze Halbzeug. - In: Werkstoffe für die Informationstechnik, (1999), S. 71-76
Vaněk, Oldrich; Hučko, B.; Držik, M.; Breternitz, Volkmar
Silicon wafer residual stresses determination by evaluating of the dynamic response. - In: 44. Internationales Wissenschaftliches Kolloquium, (1999), insges. 5 S.
Silicon wafer residual stresses determination by evaluating of the dynamic response. - In: 44. Internationales Wissenschaftliches Kolloquium, (1999), insges. 5 S.
Schawohl, Jens; Spieß, Lothar; Teichert, Gerd; Reich, Steffen; Böswetter, Gerd
Charakterisierung von CVD-Hartstoffschichten auf Hartmetall. - In: 44. Internationales Wissenschaftliches Kolloquium, (1999), insges. 7 S.
Charakterisierung von CVD-Hartstoffschichten auf Hartmetall. - In: 44. Internationales Wissenschaftliches Kolloquium, (1999), insges. 7 S.
Spieß, Lothar; Knedlik, Christian
Nanostrukturierte Werkstoffe - Meßnormale?. - In: 44. Internationales Wissenschaftliches Kolloquium, (1999), insges. 6 S.
Nanostrukturierte Werkstoffe - Meßnormale?. - In: 44. Internationales Wissenschaftliches Kolloquium, (1999), insges. 6 S.
Novotny, I.; Breternitz, Volkmar; Ivanic, R.; Knedlik, Christian; Tvarozek, Vladimir; Spieß, Lothar; Rehacek, Vlastimil
Thin film microelectrode arrays for electrochemical biosensors. - In: [Vortragsreihen, (1999), S. 215-220
Thin film microelectrode arrays for electrochemical biosensors. - In: [Vortragsreihen, (1999), S. 215-220
Romanus, Henry;
Teichert, Gerd; Spieß, Lothar
Investigation of polymorphism and estimation of lattice constants of SiC epilayers by four circle X-ray diffraction. - In: Silicon carbide, III-nitrides and related materials, (1998), S. 437-440
Investigation of polymorphism and estimation of lattice constants of SiC epilayers by four circle X-ray diffraction. - In: Silicon carbide, III-nitrides and related materials, (1998), S. 437-440