Gubisch, Maik; Liu, Yonghe; Kups, Thomas; Romanus, Henry; Spieß, Lothar; Schäfer, Jürgen A.; Knedlik, Christian
Entwicklung von nanoskaligen Wolframkarbid-Schichtsystemen für funktionelle Oberflächen einer NPM-Maschine. - In: Maschinenbau von Makro bis Nano, 2005, [01.10], insges. 2 S.
http://www.db-thueringen.de/servlets/DocumentServlet?id=16753
Entwicklung von nanoskaligen Wolframkarbid-Schichtsystemen für funktionelle Oberflächen einer NPM-Maschine. - In: Maschinenbau von Makro bis Nano, 2005, [01.10], insges. 2 S.
http://www.db-thueringen.de/servlets/DocumentServlet?id=16753
Elbahri, Mady; Jebril, Seid; Raudra, Shiva Kumar; Cengher, Dorin; Cimalla, Volker; Ambacher, Oliver; Paretkar, Dadhichi; Wille, Sebastian; Adelung, Rainer
New route of nanowire integration in microfabrication processes for sensor applications. - In: Nanofair 2005, (2005), S. 17-20
New route of nanowire integration in microfabrication processes for sensor applications. - In: Nanofair 2005, (2005), S. 17-20
Zöppig, Veit; Kallenbach, Eberhard; Beyer, Frank; Baumbach, Jens; Ströhla, Tom; Kallenbach, Matthias
Fast acting magnetic actuators for automotive applications. - In: Proceedings of the twentieth annual meeting, (2005), S. 246-249
Fast acting magnetic actuators for automotive applications. - In: Proceedings of the twentieth annual meeting, (2005), S. 246-249
Ertel-Ingrisch, Werner; Hartmann, Karsten; Wang, X; Hülsenberg, Dagmar
Experimental investigation of the crystallization of BHF in high magnetic fields. - In: Materials processing in magnetic fields, (2005), S. 29-40
Experimental investigation of the crystallization of BHF in high magnetic fields. - In: Materials processing in magnetic fields, (2005), S. 29-40
Förster, Christian; Cimalla, Volker; Aperathitis, Elias; Brückner, Klemens; Stephan, Ralf; Hein, Matthias; Pezoldt, Jörg; Ambacher, Oliver
Fabrication of 3C-SiC/Si MEMS and NEMS for sensor applications. - In: HeT-SiC-05, (2005), S. 44-49
Fabrication of 3C-SiC/Si MEMS and NEMS for sensor applications. - In: HeT-SiC-05, (2005), S. 44-49
Pezoldt, Jörg; Zgheib, Charbel; Förster, Christian; Morales, Francisco M.; Cherkachinin, G.; Wang, Chunyu; Leycuras, A.; Ferro, Gabriel; Monteil, Y.; Cimalla, Irina
Stress design in 3C-SiC/Si heteroepitaxial systems. - In: HeT-SiC-05, (2005), S. 20-26
Stress design in 3C-SiC/Si heteroepitaxial systems. - In: HeT-SiC-05, (2005), S. 20-26
Förster, Christian; Cimalla, Volker; Brueckner, Klemens; Lebedev, Vadim; Stephan, Ralf; Hein, Matthias; Ambacher, Oliver
Processing of novel SiC and group III-nitride based micro- and nanomechanical devices. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 202 (2005), 4, S. 671-676
http://dx.doi.org/10.1002/pssa.200460471
Processing of novel SiC and group III-nitride based micro- and nanomechanical devices. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 202 (2005), 4, S. 671-676
http://dx.doi.org/10.1002/pssa.200460471
Barth, Stephan; Koch, H.; Peinke, Joachim; Burgold, Jörg; Wurmus, Helmut
Laser-Cantilever-Anemometer. - In: Progress in turbulence, (2005), S. 129-132
Laser-Cantilever-Anemometer. - In: Progress in turbulence, (2005), S. 129-132
Machleidt, Torsten; Hild, Wolfram; Liu, Yonghe; Spieß, Lothar; Schäfer, Jürgen A.; Franke, Karl-Heinz
Quantitativ assessment of the wear of an afm tip by blind tip estimation. - In: 1st Vienna International Conference Micro- and Nano-Technology, (2005), S. 323-328
Quantitativ assessment of the wear of an afm tip by blind tip estimation. - In: 1st Vienna International Conference Micro- and Nano-Technology, (2005), S. 323-328
Morales, Francisco M.; Förster, Christian; Ambacher, Oliver; Pezoldt, Jörg
Beta to alpha transition and defects on SiC on Si grown by CVD. - In: Microscopy of semiconducting materials, (2005), S. 131-134
Beta to alpha transition and defects on SiC on Si grown by CVD. - In: Microscopy of semiconducting materials, (2005), S. 131-134