Safonov, K. L.; Trushin, Yuri V.; Ambacher, Oliver; Pezoldt, Jörg
Computer simulation of the early stages of nano scale SiC growth on Si. - In: Silicon carbide and related materials 2004, (2005), S. 169-172
Computer simulation of the early stages of nano scale SiC growth on Si. - In: Silicon carbide and related materials 2004, (2005), S. 169-172
Hotovy, Ivan; Kremmer, J.; Huran, Jozef; Siciliano, Pietro; Capone, Simonetta; Spieß, Lothar
Characterization and gas sensing properties of NiO thin films. - In: Sensors and microsystems, (2004), S. 185-190
Characterization and gas sensing properties of NiO thin films. - In: Sensors and microsystems, (2004), S. 185-190
Schilling, Cornelius; Müller, Ralf; Kempf, Wolfgang; Stubenrauch, Mike; Witte, Hartmut
Ein netzbasiertes Lehr- und Informationssystem zur ökologischen, toxikologischen und medizintechnischen Relevanz chemischer Elemente für Techniker und Ingenieurstudenten. - In: Macro and trace elements, (2004), S. 525-531
Ein netzbasiertes Lehr- und Informationssystem zur ökologischen, toxikologischen und medizintechnischen Relevanz chemischer Elemente für Techniker und Ingenieurstudenten. - In: Macro and trace elements, (2004), S. 525-531
Förster, Christian; Schnabel, F.; Weih, Petia; Stauden, Thomas; Ambacher, Oliver; Pezoldt, Jörg
In situ spectroscopic ellipsometry of hydrogen-argon plasma cleaned silicon surfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 455/456 (2004), S. 695-699
https://doi.org/10.1016/j.tsf.2003.11.255
In situ spectroscopic ellipsometry of hydrogen-argon plasma cleaned silicon surfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 455/456 (2004), S. 695-699
https://doi.org/10.1016/j.tsf.2003.11.255
Zgheib, Charbel; Förster, Christian; Weih, Petia; Cimalla, Volker; Kazan, Michel; Masri, Pierre; Ambacher, Oliver; Pezoldt, Jörg
Infrared ellipsometry of SiC/Si heterostructures with Ge modified interfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 455/456 (2004), S. 183-186
https://doi.org/10.1016/j.tsf.2003.11.208
Infrared ellipsometry of SiC/Si heterostructures with Ge modified interfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 455/456 (2004), S. 183-186
https://doi.org/10.1016/j.tsf.2003.11.208
Hotovy, Ivan; Huran, Jozef; Spieß, Lothar; Gubisch, Maik; Schawohl, Jens
NiO modified thin films for gas monitoring. - In: The Fifth International Conference on Advanced Semiconductor Devices and Microsystems, 2004, (2004), S. 303-306
http://dx.doi.org/10.1109/ASDAM.2004.1441221
NiO modified thin films for gas monitoring. - In: The Fifth International Conference on Advanced Semiconductor Devices and Microsystems, 2004, (2004), S. 303-306
http://dx.doi.org/10.1109/ASDAM.2004.1441221
Perrone, Rubén; Thust, Heiko; Drüe, Karl-Heinz
Progress in the integration of planar and 3D coils on LTCC by using photoimageable inks. - In: IMAPS 2004, (2004), insges. 4 S.
Progress in the integration of planar and 3D coils on LTCC by using photoimageable inks. - In: IMAPS 2004, (2004), insges. 4 S.
Shokhovets, Sviatoslav; Fuhrmann, Daniel; Goldhahn, Rüdiger; Gobsch, Gerhard; Ambacher, Oliver; Hermann, Martin; Eickhoff, Martin
Temperature-dependent electric fields in GaN Schottky diodes studied by electroreflectance. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 163-166
http://dx.doi.org/10.1016/j.tsf.2003.10.064
Temperature-dependent electric fields in GaN Schottky diodes studied by electroreflectance. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 163-166
http://dx.doi.org/10.1016/j.tsf.2003.10.064
Buchheim, Carsten; Winzer, Andreas T.; Goldhahn, Rüdiger; Gobsch, Gerhard; Ambacher, Oliver; Link, Angela; Eickhoff, Martin; Stutzmann, Martin
Photoreflectance studies of (Al)Ga- and N-face AlGaN/GaN heterostructures. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 155-158
http://dx.doi.org/10.1016/j.tsf.2003.10.062
Photoreflectance studies of (Al)Ga- and N-face AlGaN/GaN heterostructures. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 155-158
http://dx.doi.org/10.1016/j.tsf.2003.10.062
Schmidt, Alexander A.; Safonov, K. L.; Trushin, Yuri V.; Cimalla, Volker; Ambacher, Oliver; Pezoldt, Jörg
Kinetic Monte Carlo simulation of SiC nucleation on Si(111). - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 201 (2004), 2, S. 333-337
http://dx.doi.org/10.1002/pssa.200303962
Kinetic Monte Carlo simulation of SiC nucleation on Si(111). - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 201 (2004), 2, S. 333-337
http://dx.doi.org/10.1002/pssa.200303962