Component screening and structure elucidation with X-rays

Topic: Component screening and structure elucidation with X-rays

Speaker: Prof. Lothar Spieß, TU Ilmenau

Time: Friday, 27.09.2024, 15:00 h

Place: TU Ilmenau,Faradaybau, Weimarer Straße 32

Admission: 5 Euro

Technical radiography is used to examine very large components such as vehicles or aircraft. This uses so-called bremsstrahlung with energies of up to seven MeV, megaelectronvolts, where KeV, kiloelectronvolts, is the unit of measurement for energy. For comparison: in medicine, radiation of no more than 150 kiloelectronvolts is used.

In his lecture at the TU Ilmenau Bürgercampus, Prof. Lothar Spieß, former Director of the Institute of Materials Science and Engineering, will illustrate the use of radiography in technology using a champagne cork or a horse's mouth basket. From his graduation in 1982 until his retirement in 2022, Prof. Spieß conducted research at TU Ilmenau, gave lectures and wrote a textbook on "Modern X-ray diffraction".

Ursula Nirsberger
TU Ilmenau Citizens' Campus
+ 49 3677 69 4794
buergercampus@tu-ilmenau.de