Miskys, Claudio R.; Kelly, Michael K.; Ambacher, Oliver; Stutzmann, Martin
Freestanding GaN-substrates and devices. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2003), 6, S. 1627-1650
http://dx.doi.org/10.1002/pssc.200303140
Freestanding GaN-substrates and devices. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2003), 6, S. 1627-1650
http://dx.doi.org/10.1002/pssc.200303140
Ambacher, Oliver; Eickhoff, Martin; Link, Angela; Hermann, Martin; Stutzmann, Martin; Bernardini, F.; Fiorentini, V.; Smorchkova, Y.; Speck, James; Mishra, Umesh; Schaff, William; Tilak, V.; Eastman, Lester F.
Electronics and sensors based on pyroelectric AlGaN/GaN heterostructures, Part A: polarization and pyroelectronics. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2003), 6, S. 1878-1907
http://dx.doi.org/10.1002/pssc.200303138
Electronics and sensors based on pyroelectric AlGaN/GaN heterostructures, Part A: polarization and pyroelectronics. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2003), 6, S. 1878-1907
http://dx.doi.org/10.1002/pssc.200303138
Eickhoff, Martin; Schalwig, J.; Steinhoff, G.; Weidemann, Olaf; Görgens, L.; Neuberger, R.; Herrmann, M.; Baur, B.; Müller, G.; Ambacher, Oliver
Electronics and sensors based on pyroelectric AlGaN/GaN heterostructures, Part B: sensor applications. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2003), 6, S. 1908-1918
http://dx.doi.org/10.1002/pssc.200303139
Electronics and sensors based on pyroelectric AlGaN/GaN heterostructures, Part B: sensor applications. - In: Physica status solidi, ISSN 1610-1642, Bd. 0 (2003), 6, S. 1908-1918
http://dx.doi.org/10.1002/pssc.200303139
Hotovy, Ivan; Huran, Jozef; Spieß, Lothar; Liday, Jozef; Sitter, Helmut; Hascik, S.
The influence of process parameters and annealing temperature on the physical properties of sputtered NiO thin films. - In: Vacuum, ISSN 0042-207X, Bd. 69 (2003), 1/3, S. 237-242
http://dx.doi.org/10.1016/S0042-207X(02)00338-X
The influence of process parameters and annealing temperature on the physical properties of sputtered NiO thin films. - In: Vacuum, ISSN 0042-207X, Bd. 69 (2003), 1/3, S. 237-242
http://dx.doi.org/10.1016/S0042-207X(02)00338-X
Hülsenberg, Dagmar; Hecht-Mijic, Stephan; Harnisch, Alf
Integration of lightwave guides in UV-microstructured glass. - In: Processing and applications of optical components, (2003), S. 65-70
Integration of lightwave guides in UV-microstructured glass. - In: Processing and applications of optical components, (2003), S. 65-70
Shokhovets, Sviatoslav; Goldhahn, Rüdiger; Gobsch, Gerhard; Ambacher, Oliver; Smorchkova, I. P.; Speck, James S.; Mishra, Umesh; Link, Angela; Hermann, Martin; Eickhoff, Martin
Electroreflectance and photoreflectance studies of electric fields in Pt/GaN Schottky diodes and AlGaN/GaN heterostructures. - In: GaN and related alloys - 2002, 2003, S. L3.57.1-L3.57.6, insges. 6 S.
Electroreflectance and photoreflectance studies of electric fields in Pt/GaN Schottky diodes and AlGaN/GaN heterostructures. - In: GaN and related alloys - 2002, 2003, S. L3.57.1-L3.57.6, insges. 6 S.
Goldhahn, Rüdiger; Žochovec, Svjatoslav; Cimalla, Volker; Spieß, Lothar; Ecke, Gernot; Ambacher, Oliver; Furthmüller, Jürgen; Bechstedt, Friedhelm; Lu, Hai; Schaff, William J.
Dielectric function of "narrow" band gap InN. - In: GaN and related alloys - 2002, 2003, S. L5.9.1-L5.9.6, insges. 6 S.
Dielectric function of "narrow" band gap InN. - In: GaN and related alloys - 2002, 2003, S. L5.9.1-L5.9.6, insges. 6 S.
Schwenk, Alexander; Nutsch, Gabriele; Gruner, Heiko
Neue Düsen-Innenkonturen für das atmosphärische Plasmaspritzen. - In: 55 Jahre DVS-Arbeitskreis Thermisches Spritzen in den neuen Bundesländern, (2003), insges. 10 S.
Neue Düsen-Innenkonturen für das atmosphärische Plasmaspritzen. - In: 55 Jahre DVS-Arbeitskreis Thermisches Spritzen in den neuen Bundesländern, (2003), insges. 10 S.
Winkler, Gert; Bischoff, Gernot; Sutor, Aneta
New materials and technologies for printed circuit boards : a development under the spell of new demands for environmentally friendly products and production steps. - In: Proceedings, (2003), S. 88-100
New materials and technologies for printed circuit boards : a development under the spell of new demands for environmentally friendly products and production steps. - In: Proceedings, (2003), S. 88-100
Dziedzic, Andrzej; Janik, Adam; Kolek, Andrzej; Ehrhardt, Waleed; Thust, Heiko
Advanced electrical and stability characterisation of untrimmed and pulse voltage or laser trimmed thick-film resistors. - In: Proceedings, (2003), S. 50-56
Advanced electrical and stability characterisation of untrimmed and pulse voltage or laser trimmed thick-film resistors. - In: Proceedings, (2003), S. 50-56