Shokhovets, Sviatoslav; Gobsch, Gerhard; Ambacher, Oliver
Momentum matrix element and conduction band nonparabolicity in wurtzite GaN. - In: Applied physics letters, ISSN 1077-3118, Bd. 86 (2005), 16, S. 161908, insges. 3 S.
http://dx.doi.org/10.1063/1.1906313
Momentum matrix element and conduction band nonparabolicity in wurtzite GaN. - In: Applied physics letters, ISSN 1077-3118, Bd. 86 (2005), 16, S. 161908, insges. 3 S.
http://dx.doi.org/10.1063/1.1906313
Liu, Yonghe; Gubisch, Maik; Hild, Wolfram; Scherge, Matthias; Spieß, Lothar; Knedlik, Christian; Schäfer, Jürgen A.
Nanoscale multilayer WC/C coatings developed for nanopositioning: Part II. Friction and wear. - In: Thin solid films, ISSN 1879-2731, Bd. 488 (2005), 1, S. 140-148
http://dx.doi.org/10.1016/j.tsf.2005.03.020
Nanoscale multilayer WC/C coatings developed for nanopositioning: Part II. Friction and wear. - In: Thin solid films, ISSN 1879-2731, Bd. 488 (2005), 1, S. 140-148
http://dx.doi.org/10.1016/j.tsf.2005.03.020
Gubisch, Maik; Liu, Yonghe; Spieß, Lothar; Romanus, Henry; Krischok, Stefan; Ecke, Gernot; Schäfer, Jürgen A.; Knedlik, Christian
Nanoscale multilayer WC/C coatings developed for nanopositioning: Part I. Microstructures and mechanical properties. - In: Thin solid films, ISSN 1879-2731, Bd. 488 (2005), 1, S. 132-139
http://dx.doi.org/10.1016/j.tsf.2005.04.107
Nanoscale multilayer WC/C coatings developed for nanopositioning: Part I. Microstructures and mechanical properties. - In: Thin solid films, ISSN 1879-2731, Bd. 488 (2005), 1, S. 132-139
http://dx.doi.org/10.1016/j.tsf.2005.04.107
Al-Ibrahim, Maher; Roth, Hans-Klaus; Schrödner, Mario; Konkin, Alexander; Zhokhavets, Uladzimir; Gobsch, Gerhard; Scharff, Peter; Sensfuss, Steffi
The influence of the optoelectronic properties of poly(3-alkylthiophenes) on the device parameters in flexible polymer solar cells. - In: Organic electronics, Bd. 6 (2005), 2, S. 65-77
http://dx.doi.org/10.1016/j.orgel.2005.02.004
The influence of the optoelectronic properties of poly(3-alkylthiophenes) on the device parameters in flexible polymer solar cells. - In: Organic electronics, Bd. 6 (2005), 2, S. 65-77
http://dx.doi.org/10.1016/j.orgel.2005.02.004
Herrera, M.; Cremades, Ana; Piqueras, Javier; Stutzmann, Martin; Ambacher, Oliver
Study of pinholes and nanotubes in AlInGaN films by cathodoluminescence and atomic force microscopy. - In: Journal of applied physics, ISSN 1089-7550, Bd. 95 (2004), 10, S. 5305-5310
https://doi.org/10.1063/1.1690454
Study of pinholes and nanotubes in AlInGaN films by cathodoluminescence and atomic force microscopy. - In: Journal of applied physics, ISSN 1089-7550, Bd. 95 (2004), 10, S. 5305-5310
https://doi.org/10.1063/1.1690454
Kaiser, Ute; Muller, David A.; Chuvilin, Andrey; Pasold, Gunnar; Witthuhn, Wolfgang
The formation of clusters and nanocrystals in Er-implanted hexagonal silicon carbide. - In: Microscopy and microanalysis, ISSN 1435-8115, Bd. 10 (2004), 2, S. 301-310
http://dx.doi.org/10.1017/S1431927604040449
The formation of clusters and nanocrystals in Er-implanted hexagonal silicon carbide. - In: Microscopy and microanalysis, ISSN 1435-8115, Bd. 10 (2004), 2, S. 301-310
http://dx.doi.org/10.1017/S1431927604040449
Gorelik, Tatiana; Kaiser, Ute; Kuhlmann, Thomas; Yulin, Sergey; Richter, Wolfgang
Structural characterization of ultrathin Cr and Sc films for soft X-ray mirrors. - In: Applied surface science, Bd. 230 (2004), 1/4, S. 1-7
http://dx.doi.org/10.1016/j.apsusc.2004.02.006
Structural characterization of ultrathin Cr and Sc films for soft X-ray mirrors. - In: Applied surface science, Bd. 230 (2004), 1/4, S. 1-7
http://dx.doi.org/10.1016/j.apsusc.2004.02.006
Chuvilin, Andrey; Kups, Thomas; Kaiser, Ute
The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination. - In: Journal of electron microscopy, ISSN 1477-9986, Bd. 53 (2004), 3, S. 237-244
http://dx.doi.org/10.1093/jmicro/53.3.237
The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination. - In: Journal of electron microscopy, ISSN 1477-9986, Bd. 53 (2004), 3, S. 237-244
http://dx.doi.org/10.1093/jmicro/53.3.237
Biskupek, Johannes; Kaiser, Ute
Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractograms. - In: Journal of electron microscopy, ISSN 1477-9986, Bd. 53 (2004), 6, S. 601-610
http://dx.doi.org/10.1093/jmicro/dfh088
Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractograms. - In: Journal of electron microscopy, ISSN 1477-9986, Bd. 53 (2004), 6, S. 601-610
http://dx.doi.org/10.1093/jmicro/dfh088
Cimalla, Volker; Schmidt, Alexander A.; Stauden, Thomas; Zekentes, K.; Ambacher, Oliver; Pezoldt, Jörg
Linear alignment of SiC dots on silicon substrates. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 22.2004, 5, S. L20-L23
http://dx.doi.org/10.1116/1.1787520
Linear alignment of SiC dots on silicon substrates. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 22.2004, 5, S. L20-L23
http://dx.doi.org/10.1116/1.1787520