Ortlepp, Ingo;
Manske, Eberhard; Füßl, Roland
Dynamic sensor positioning in large measuring volumes by an inverse kinematic concept. - In: Journal of physics, ISSN 1742-6596, Bd. 1065 (2018), 14, 142009, insges. 4 S.
https://doi.org/10.1088/1742-6596/1065/14/142009
Dynamic sensor positioning in large measuring volumes by an inverse kinematic concept. - In: Journal of physics, ISSN 1742-6596, Bd. 1065 (2018), 14, 142009, insges. 4 S.
https://doi.org/10.1088/1742-6596/1065/14/142009
Günther, Ludwig; Rothleitner, Christian; Schleichert, Jan; Rogge, Norbert; Vasilyan, Suren; Härtig, Frank; Fröhlich, Thomas
The Planck-Balance - primary mass metrology for industrial applications. - In: Journal of physics, ISSN 1742-6596, Bd. 1065 (2018), 4, 042021, insges. 4 S.
https://doi.org/10.1088/1742-6596/1065/4/042021
The Planck-Balance - primary mass metrology for industrial applications. - In: Journal of physics, ISSN 1742-6596, Bd. 1065 (2018), 4, 042021, insges. 4 S.
https://doi.org/10.1088/1742-6596/1065/4/042021
Holz, Mathias;
Guliyev, Elshad; Ahmad, Ahmad; Ivanov, Tzvetan; Reum, Alexander; Hofmann, Martin; Lenk, Claudia; Kästner, Marcus; Reuter, Christoph; Lenk, Steve; Rangelow, Ivo W.; Nikolov, Nikolay
Field-emission scanning probe lithography tool for 150 mm wafer. - In: Journal of vacuum science & technology, ISSN 2166-2754, Bd. 36 (2018), 6, 06J106, insges. 7 S.
https://doi.org/10.1116/1.5048357
Field-emission scanning probe lithography tool for 150 mm wafer. - In: Journal of vacuum science & technology, ISSN 2166-2754, Bd. 36 (2018), 6, 06J106, insges. 7 S.
https://doi.org/10.1116/1.5048357
Lenk, Claudia;
Hofmann, Martin; Ivanov, Tzvetan; Ahmad, Ahmad; Lenk, Steve; Rangelow, Ivo W.; Reum, Alexander; Reuter, Christoph; Holz, Mathias; Behzadirad, Mahmoud; Rishinaramangalam, Ashwin K.; Feezell, Daniel; Busani, Tito
Sharp GaN nanowires used as field emitter on active cantilevers for scanning probe lithography. - In: Journal of vacuum science & technology, ISSN 2166-2754, Bd. 36 (2018), 6, 06JL04, insges. 6 S.
https://doi.org/10.1116/1.5048190
Sharp GaN nanowires used as field emitter on active cantilevers for scanning probe lithography. - In: Journal of vacuum science & technology, ISSN 2166-2754, Bd. 36 (2018), 6, 06JL04, insges. 6 S.
https://doi.org/10.1116/1.5048190
Lenk, Claudia;
Lenk, Steve; Holz, Mathias; Guliyev, Elshad; Hofmann, Martin; Ivanov, Tzvetan; Rangelow, Ivo W.; Behzadirad, Mahmoud; Rishinaramangalam, Ashwin K.; Feezell, Daniel; Busani, Tito
Experimental study of field emission from ultrasharp silicon, diamond, GaN, and tungsten tips in close proximity to the counter electrode. - In: Journal of vacuum science & technology, ISSN 2166-2754, Bd. 36 (2018), 6, 06JL03, insges. 7 S.
https://doi.org/10.1116/1.5048518
Experimental study of field emission from ultrasharp silicon, diamond, GaN, and tungsten tips in close proximity to the counter electrode. - In: Journal of vacuum science & technology, ISSN 2166-2754, Bd. 36 (2018), 6, 06JL03, insges. 7 S.
https://doi.org/10.1116/1.5048518
Rangelow, Ivo W.;
Kästner, Marcus; Ivanov, Tzvetan; Ahmad, Ahmad; Lenk, Steve; Lenk, Claudia; Guliyev, Elshad; Reum, Alexander; Hofmann, Martin; Reuter, Christoph; Holz, Mathias
Atomic force microscope integrated with a scanning electron microscope for correlative nanofabrication and microscopy. - In: Journal of vacuum science & technology, ISSN 2166-2754, Bd. 36 (2018), 6, 06J102, insges. 9 S.
https://doi.org/10.1116/1.5048524
Atomic force microscope integrated with a scanning electron microscope for correlative nanofabrication and microscopy. - In: Journal of vacuum science & technology, ISSN 2166-2754, Bd. 36 (2018), 6, 06J102, insges. 9 S.
https://doi.org/10.1116/1.5048524
Hofmann, Martin;
Lenk, Claudia; Ivanov, Tzvetan; Rangelow, Ivo W.; Reum, Alexander; Ahmad, Ahmad; Holz, Mathias; Manske, Eberhard
Field emission from diamond nanotips for scanning probe lithography. - In: Journal of vacuum science & technology, ISSN 2166-2754, Bd. 36 (2018), 6, 06JL02, insges. 6 S.
https://doi.org/10.1116/1.5048193
Field emission from diamond nanotips for scanning probe lithography. - In: Journal of vacuum science & technology, ISSN 2166-2754, Bd. 36 (2018), 6, 06JL02, insges. 6 S.
https://doi.org/10.1116/1.5048193
Bergmann, Jean Pierre; Reimche, Maxim; Eiber, Mathias
Digitalisierung in der Fertigungskette - Fluch oder Segen für die Fügetechnik?. - In: DVS Congress 2018, (2018), S. 177-180
Digitalisierung in der Fertigungskette - Fluch oder Segen für die Fügetechnik?. - In: DVS Congress 2018, (2018), S. 177-180
Henckell, Philipp;
Ali, Yarop; Reimann, Jan; Bergmann, Jean Pierre
Lichtbogenbasierte Additive Fertigung: Modellierung der Bauteileigenschaften. - In: DVS Congress 2018, (2018), S. 104-108
Lichtbogenbasierte Additive Fertigung: Modellierung der Bauteileigenschaften. - In: DVS Congress 2018, (2018), S. 104-108
Pezoldt, Jörg; Kalnin, Andrei Alexandrovich
Defects and polytype instabilities. - In: Silicon carbide and related materials 2017, (2018), S. 147-150
Defects and polytype instabilities. - In: Silicon carbide and related materials 2017, (2018), S. 147-150