Konferenzbeiträge ab 2018

Anzahl der Treffer: 1349
Erstellt: Sun, 30 Jun 2024 22:05:54 +0200 in 0.3409 sec


Spiegler, Jennifer; Kuhlmann, Ulrike; Mückenheim, Uwe; Keitel, Steffen; Hammer, Stefan; Rasche, Stefan; Hildebrand, Jörg; Bergmann, Jean Pierre
Tragfähigkeit von Stumpfnahtverbindungen höherfester Stähle im Stahlbau. - In: DVS Congress 2020, (2020), S. 557-563

Kästner, Christian; Neugebauer, Matthias; Schricker, Klaus; Bergmann, Jean Pierre
Laserstrahlauftragschweißen - Steigern der Produktivität beim gepulsten Schweißen von Nickelbasis-Superlegierungen. - In: DVS Congress 2020, (2020), S. 517-523

Hübner, Matthias; Lenk, Leonhard; Markweg, Eric; Sinzinger, Stefan
Compressive sensing hyperspectral imaging with optimized diffractive optical elements. - In: Photonic Instrumentation Engineering VII, (2020), insges. 1 S.

Hyperspectral image acquisition is challenging due to its three-dimensional dataset consisting of two spatial and one spectral dimensions. Available spectral imagers are either based on spatial or spectral scanning or they sacrifice spatial and spectral resolution for snapshot imaging. Compressive Sensing techniques have already been applied to spectral imaging to enhance the image acquisition, but they still rely on multiple consecutive measurements. We utilize several diffraction orders of a novel diffractive optical element whose diffraction efficiency has been optimized for a broad wavelength range. Based on this diffractive optical element we design and compare novel compressive snapshot spectral imaging systems and present experimental results.



https://doi.org/10.1117/12.2548037
Busani, Tito L.; Rangelow, Ivo W.
Recent advancements of III-N materials in probe scanning lithography and metrology. - In: Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2020, (2020), insges. 1 S.

The steady advance of nanotechnology from investigation to application and to manufacturing is increasing the demands on nanoscale metrology and lithography and surface chemical analysis. As dimensions shrink to the nano-scale, the available metrologies, necessary for any advanced manufacturing process, become limited. In this seminar we present how we can achieve state of the art results in nano lithography and metrology and possibly NSOM using functionalized III-N nanowires. We will show as, such a single wide-bandgap tip technology offers the functionality and versatility of several incumbent technologies in one single, universal, system.



https://doi.org/10.1117/12.2555095
Romanyuk, Oleksandr; Supplie, Oliver; Paszuk, Agnieszka; Stoeckmann, Jan Philipp; Wilks, Regan George; Bombsch, Jakob; Hartmann, Claudia; Garcia Diez, Raul; Ueda, Shigenori; Bartoš, Igor; Gordeev, Ivan; Houdkova, Jana; Kleinschmidt, Peter; Bär, Marcus; Jiříček, Petr; Hannappel, Thomas
Hard X-ray photoelectron spectroscopy study of core level shifts at buried GaP/Si(001) interfaces. - In: Surface and interface analysis, ISSN 1096-9918, Bd. 52 (2020), 12, S. 933-938

We present a study of buried GaP/Si(001) heterointerfaces by hard X-ray photoelectron spectroscopy. Well-defined thin (4-50 nm) GaP films were grown on Si(001) substrates with 2˚ miscut orientations by metalorganic vapor phase epitaxy. Core level photoelectron intensities and valence band spectra were measured on heterostructures as well as on the corresponding reference (bulk) substrates. Detailed analysis of core level peaks revealed line broadening and energetic shifts. Valence band offsets were derived for the films with different thickness. Based on the observed variation of the valence band offsets with the GaP film thickness and on the experimental evidence of line broadening, the existence of charge displacement at the GaP/Si(001) interface is suggested.



https://doi.org/10.1002/sia.6829
Hassan, Nina; Käske, Martin; Schneider, Christian; Sommerkorn, Gerd; Thomä, Reiner; Matolak, David
Measurement-based determination of parameters for non-stationary TDL models with reduced number of taps. - In: IET microwaves, antennas & propagation, ISSN 1751-8733, Bd. 14 (2020), 14, S. 1719-1732

This study proposes a new strategy of extracting parameters for tapped delay line (TDL) channel models from vehicle to infrastructure channel measurements. The proposed approach is based on an already existing method to derive parameters for a non-stationary model using first-order Markov chains. It will be shown that with the proposed method, the number of taps necessary to regenerate the delay spread of a channel can be significantly reduced. An approach will be discussed to evaluate the performance of the model. The feasibility of the method will be confirmed using channel sounding measurements.



https://doi.org/10.1049/iet-map.2019.0945
Weigert, Florian; Theska, René
Investigations on kinematic couplings for tool-changing interfaces in highest-precision devices. - In: Proceedings of the 20th International Conference of the European Society for Precision Engineering and Nanotechnology, (2020), S. 557-558

Hebenstreit, Roman; Theska, René; Wedrich, Karin; Strehle, Steffen
Conceptional design of a positioning device with subatomic resolution and reproducibility. - In: Proceedings of the 20th International Conference of the European Society for Precision Engineering and Nanotechnology, (2020), S. 305-306

Röse, Anni; Liu, Yang; Köchert, Paul; Prellinger, Günther; Manske, Eberhard; Pollinger, Florian
Modulation-based long-range interferometry as basis for an optical two-color temperature sensor. - In: Proceedings of the 20th International Conference of the European Society for Precision Engineering and Nanotechnology, (2020), S. 299-300

Darnieder, Maximilian; Pabst, Markus; Fröhlich, Thomas; Theska, René
Corner loading and its influence on the tilt sensitivity of precision weighing cells. - In: Proceedings of the 20th International Conference of the European Society for Precision Engineering and Nanotechnology, (2020), S. 95-98