Zeitschriftenaufsätze und Buchbeiträge

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Supplie, Oliver; Romanyuk, Oleksandr; Koppka, Christian; Steidl, Matthias; Nägelein, Andreas; Paszuk, Agnieszka; Winterfeld, Lars; Dobrich, Anja; Kleinschmidt, Peter; Runge, Erich; Hannappel, Thomas
Metalorganic vapor phase epitaxy of III-V-on-silicon: experiment and theory. - In: Progress in crystal growth and characterization of materials, ISSN 1878-4208, Bd. 64 (2018), 4, S. 103-132

https://doi.org/10.1016/j.pcrysgrow.2018.07.002
Lebedev, Alexander A.; Davydov, Valery Yu.; Usachov, Dmitry Yu.; Lebedev, Sergey P.; Smirnov, Alexander N.; Eliseyev, Ilya A.; Dunaevskiy, M. S.; Gushchina, E. V.; Bokai, K. A.; Pezoldt, Jörg
High quality graphene grown by sublimation on 4H-SiC (0001). - In: Semiconductors, ISSN 1090-6479, Bd. 52 (2018), 14, S. 1882-1885

https://doi.org/10.1134/S1063782618140154
Grohmann, Lukas; Bund, Andreas; Lammel, Patricia
Thermosonisches Drahtbonden auf galvanisch abgeschiedenen Oberflächen - Teil 2. - In: Produktion von Leiterplatten und Systemen, ISSN 1436-7505, Bd. 20 (2018), 11, S. 1806-1815

Chernysheva, Daria; Vlaic, Codruta; Leontyev, Igor; Pudova, Lyudmila; Ivanov, Svetlozar; Avramenko, Marina; Allix, Mathieu; Rakhmatullin, Aydar; Maslova, Olga; Bund, Andreas; Smirnova, Nina
Synthesis of Co3O4/CoOOH via electrochemical dispersion using a pulse alternating current method for lithium-ion batteries and supercapacitors. - In: Solid state sciences, ISSN 1293-2558, Bd. 86 (2018), S. 53-59
Im Titel sind "3" und "4" tiefgestellt

https://doi.org/10.1016/j.solidstatesciences.2018.10.005
Wiegmann, Christoph; Wolff, J.; Bund, Andreas
Characterization and influence on the fatigue properties of the metal-turn-over of an electroless nickel coating on an AlCuMgFeNi alloy. - In: Galvanotechnik, ISSN 0016-4232, Bd. 109 (2018), 8, S. 1538-1547

Kaltwasser, Mahsa; Schmidt, Udo; Biswas, Shantonu; Reiprich, Johannes; Schlag, Leslie; Isaac, Nishchay Angel; Stauden, Thomas; Jacobs, Heiko O.
Core-shell transformation-imprinted solder bumps enabling low-temperature fluidic self-assembly and self-alignment of chips and high melting point interconnects. - In: ACS applied materials & interfaces, ISSN 1944-8252, Bd. 10 (2018), 47, S. 40608-40613

https://doi.org/10.1021/acsami.8b12390
Winterfeld, Lars; Koppka, Christian; Abou-Ras, Daniel; Kleinschmidt, Peter; Supplie, Oliver; Hannappel, Thomas; Runge, Erich
Mechanism of twin-reduced III-V epitaxy on As-modified vicinal Si(111). - In: Physical review materials, ISSN 2475-9953, Bd. 2 (2018), 12, S. 124601

https://doi.org/10.1103/PhysRevMaterials.2.124601
Günther-Müller, Sarah; Si, Shuhao; D'heer, Herbert; Van Thourhout, Dries; Hoffmann, Martin
FDTS as dewetting coating for an electrowetting controlled silicon photonic switch. - In: IEEE photonics technology letters, Bd. 30 (2018), 23, S. 2005-2008

https://doi.org/10.1109/LPT.2018.2874351
Biswas, Shantonu; Reiprich, Johannes; Pezoldt, Jörg; Hein, Matthias; Stauden, Thomas; Jacobs, Heiko O.
Stress-adaptive meander track for stretchable electronics. - In: Flexible and printed electronics, ISSN 2058-8585, Bd. 3 (2018), 3, 032001, S. 1-7

Stretchable metallic interconnects are commonly designed using a meander-shaped metal track with a uniform width. This article reports on a 'stress-adaptive' metal track design which varies in width to accommodate the produced torque in the metal track during stretching. The stress-adaptive design is inspired by computational and experimental studies of two conventional meander-shape metal tracks identifying a common failure mode; specifically, the propagation of torque leading to twist and mechanical fatigue. The understanding gained led to the stress-adaptive design. The stress-adaptive structure is compared with horseshoe- and U-shaped references and shows improvements in the stress distribution, levels of twist, maximum level of elongation (>320%), and required stretch and release cycles (>6000 at 150% elongation) to cause failure in a long term cycling test.



https://doi.org/10.1088/2058-8585/aad583
Nägelein, Andreas; Steidl, Matthias; Korte, Stefan; Voigtländer, Bert; Prost, Werner; Kleinschmidt, Peter; Hannappel, Thomas
Investigation of charge carrier depletion in freestanding nanowires by a multi-probe scanning tunneling microscope. - In: Nano research, ISSN 1998-0000, Bd. 11 (2018), 11, S. 5924-5934

https://doi.org/10.1007/s12274-018-2105-x