Publication list FG Nanotechnology

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Lübbers, Benedikt; Schober, Andreas;
Comparing the ISFET to the glass electrode: advantages, challenges and similarities. - In: Chemical analysis, ISSN 0009-2223, Bd. 54 (2009), 6, S. 1121-1148

Andreadou, Ariadne; Pezoldt, Jörg; Förster, Christian; Polychroniadis, Efstathios K.; Voelskow, Matthias; Skorupa, Wolfgang
Buckling stabilization and stress reduction in SiC on Si by i-FLASiC processing. - In: Materials science forum, ISSN 1662-9752, Bd. 600/603 (2009), S. 239-242

http://dx.doi.org/10.4028/www.scientific.net/MSF.600-603.239
Niebelschütz, Florentina; Brückner, Klemens; Cimalla, Volker; Hein, Matthias; Pezoldt, Jörg
Performance modification of SiC MEMS. - In: Silicon carbide and related materials 2008, (2009), S. 621-624

http://dx.doi.org/10.4028/www.scientific.net/MSF.615-617.621
Kolaklieva, Lilyana; Kakanakov, Roumen; Stefanov, Plamen; Cimalla, Volker; Maroldt, Stephan; Ambacher, Oliver; Tonisch, Katja; Niebelschütz, Florentina
Composition and interface chemistry dependence in Ohmic contacts to GaN HEMT structures on the Ti/Al ratio and annealing conditions. - In: Silicon carbide and related materials 2008, (2009), S. 951-954

http://dx.doi.org/10.4028/www.scientific.net/MSF.615-617.951
Peyre, Hervé; Pezoldt, Jörg; Voelskow, Matthias; Skorupa, Wolfgang; Camassel, Jean
SIMS investigation of Ge x(4H-SiC) 1-x solid solutions synthesized by Ge-ion implantation up to x=0.2. - In: Silicon carbide and related materials 2008, (2009), S. 465-468

http://dx.doi.org/10.4028/www.scientific.net/MSF.615-617.465
Pezoldt, Jörg;
Formation of different carbon phases on SiC. - In: Silicon carbide and related materials 2008, (2009), S. 227-230

http://dx.doi.org/10.4028/www.scientific.net/MSF.615-617.227
Nader, Richard; Kazan, Michel; Zgheib, Charbel; Pezoldt, Jörg; Masri, Pierre
Properties of surface and interface structure of AlN/3CSiC/Ge/Si (1 1 1) heterostructure. - In: Journal of crystal growth, Bd. 311 (2009), 23/24, S. 4665-4669

http://dx.doi.org/10.1016/j.jcrysgro.2009.08.034
Pezoldt, Jörg; Kups, Thomas; Stauden, Thomas; Schröter, Bernd
Polarity determination and control of SiC grown on Si. - In: Materials science and engineering. Solid state materials for advanced technology / American Society for Metals. - New York, NY [u.a.] : Elsevier, 1988- , ISSN: 1873-4944 , ZDB-ID: 1492109-1, ISSN 1873-4944, Bd. 165 (2009), 1/2, S. 28-33

http://dx.doi.org/10.1016/j.mseb.2009.03.015
Tschumak, Elena; Tonisch, Katja; Pezoldt, Jörg; As, Donat J.
Comparative study of 3C-GaN grown on semi-insulating 3C-SiC/Si(100) substrates. - In: Silicon carbide and related materials 2008, (2009), S. 943-946

http://dx.doi.org/10.4028/www.scientific.net/MSF.615-617.943
Kups, Thomas; Tonisch, Katja; Voelskow, Matthias; Skorupa, Wolfgang; Konkin, Alexander L.; Pezoldt, Jörg
Structure and lattice location of Ge implanted 4H-SiC. - In: Materials science forum, ISSN 1662-9752, Bd. 600/603 (2009), S. 623-626

http://dx.doi.org/10.4028/www.scientific.net/MSF.600-603.623