Förster, Christian; Schnabel, F.; Weih, Petia; Stauden, Thomas; Ambacher, Oliver; Pezoldt, Jörg
In situ spectroscopic ellipsometry of hydrogen-argon plasma cleaned silicon surfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 455/456 (2004), S. 695-699
https://doi.org/10.1016/j.tsf.2003.11.255
In situ spectroscopic ellipsometry of hydrogen-argon plasma cleaned silicon surfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 455/456 (2004), S. 695-699
https://doi.org/10.1016/j.tsf.2003.11.255
Zgheib, Charbel; Förster, Christian; Weih, Petia; Cimalla, Volker; Kazan, Michel; Masri, Pierre; Ambacher, Oliver; Pezoldt, Jörg
Infrared ellipsometry of SiC/Si heterostructures with Ge modified interfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 455/456 (2004), S. 183-186
https://doi.org/10.1016/j.tsf.2003.11.208
Infrared ellipsometry of SiC/Si heterostructures with Ge modified interfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 455/456 (2004), S. 183-186
https://doi.org/10.1016/j.tsf.2003.11.208
Shokhovets, Sviatoslav; Fuhrmann, Daniel; Goldhahn, Rüdiger; Gobsch, Gerhard; Ambacher, Oliver; Hermann, Martin; Eickhoff, Martin
Temperature-dependent electric fields in GaN Schottky diodes studied by electroreflectance. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 163-166
http://dx.doi.org/10.1016/j.tsf.2003.10.064
Temperature-dependent electric fields in GaN Schottky diodes studied by electroreflectance. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 163-166
http://dx.doi.org/10.1016/j.tsf.2003.10.064
Buchheim, Carsten; Winzer, Andreas T.; Goldhahn, Rüdiger; Gobsch, Gerhard; Ambacher, Oliver; Link, Angela; Eickhoff, Martin; Stutzmann, Martin
Photoreflectance studies of (Al)Ga- and N-face AlGaN/GaN heterostructures. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 155-158
http://dx.doi.org/10.1016/j.tsf.2003.10.062
Photoreflectance studies of (Al)Ga- and N-face AlGaN/GaN heterostructures. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 155-158
http://dx.doi.org/10.1016/j.tsf.2003.10.062
Schmidt, Alexander A.; Safonov, K. L.; Trushin, Yuri V.; Cimalla, Volker; Ambacher, Oliver; Pezoldt, Jörg
Kinetic Monte Carlo simulation of SiC nucleation on Si(111). - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 201 (2004), 2, S. 333-337
http://dx.doi.org/10.1002/pssa.200303962
Kinetic Monte Carlo simulation of SiC nucleation on Si(111). - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 201 (2004), 2, S. 333-337
http://dx.doi.org/10.1002/pssa.200303962
Cimalla, Volker; Schmidt, Alexander A.; Stauden, Thomas; Zekentes, K.; Ambacher, Oliver; Pezoldt, Jörg
Linear alignment of SiC dots on silicon substrates. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 22.2004, 5, S. L20-L23
http://dx.doi.org/10.1116/1.1787520
Linear alignment of SiC dots on silicon substrates. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 22.2004, 5, S. L20-L23
http://dx.doi.org/10.1116/1.1787520
Arndt, Christian; Zhokhavets, Uladzimir; Mohr, Martina; Gobsch, Gerhard; Al-Ibrahim, Maher; Sensfuss, Steffi
Determination of polaron lifetime and mobility in a polymer/fullerene solar cell by means of photoinduced absorption. - In: Synthetic metals, Bd. 147 (2004), 1/3, S. 257-260
http://dx.doi.org/10.1016/j.synthmet.2004.06.037
Determination of polaron lifetime and mobility in a polymer/fullerene solar cell by means of photoinduced absorption. - In: Synthetic metals, Bd. 147 (2004), 1/3, S. 257-260
http://dx.doi.org/10.1016/j.synthmet.2004.06.037
Skorupa, Wolfgang; Panknin, D.; Voelskow, Matthias; Anwand, W.; Ferro, Gabriel; Moteil, Y.; Leycuras, A.; Pezoldt, Jörg; McMahon, R.; Smith, M.
Advanced thermal processing of semiconductor materials by flash lamp annealing. - In: Silicon front-end junction formation - physics and technology, 2004, S. C4.16.1-C4.16.6, insges. 6 S.
Advanced thermal processing of semiconductor materials by flash lamp annealing. - In: Silicon front-end junction formation - physics and technology, 2004, S. C4.16.1-C4.16.6, insges. 6 S.
Martinez-Criado, Gema; Miskys, Claudio; Karrer, Uwe; Ambacher, Oliver; Stutzmann, Martin
Two-dimensional electron gas recombination in undoped AlGaN/GaN heterostructures. - In: Japanese journal of applied physics, ISSN 1347-4065, Bd. 43.2004, Pt. 1, 6A, S. 3360-3366
http://dx.doi.org/10.1143/JJAP.43.3360
Two-dimensional electron gas recombination in undoped AlGaN/GaN heterostructures. - In: Japanese journal of applied physics, ISSN 1347-4065, Bd. 43.2004, Pt. 1, 6A, S. 3360-3366
http://dx.doi.org/10.1143/JJAP.43.3360
Aperathitis, Elias; Modreanu, Mircea; Bender, Marcus; Cimalla, Volker; Ecke, Gernot; Androulidaki, M.; Pelekanos, Nikos
Optical characterization of indium-tin-oxynitride fabricated by RF-sputtering. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 101-104
http://dx.doi.org/10.1016/j.tsf.2003.10.046
Optical characterization of indium-tin-oxynitride fabricated by RF-sputtering. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 101-104
http://dx.doi.org/10.1016/j.tsf.2003.10.046