Lozano, Juan Gabriel; Morales, Francisco M.; García, Rafael; Lebedev, Vadim; Cimalla, Volker; Ambacher, Oliver; González, David
Evaluation of the influence of GaN and AlN as pseudosubstrates on the crystalline quality of InN layers. - In: Physica status solidi, ISSN 1610-1642, Bd. 4 (2007), 4, S. 1454-1457
http://dx.doi.org/10.1002/pssc.200674114
Evaluation of the influence of GaN and AlN as pseudosubstrates on the crystalline quality of InN layers. - In: Physica status solidi, ISSN 1610-1642, Bd. 4 (2007), 4, S. 1454-1457
http://dx.doi.org/10.1002/pssc.200674114
Cimalla, Volker; Pradarutti, Boris; Matthäus, Gabor; Brückner, Claudia; Riehemann, Stefan; Notni, Gunther; Nolte, Stefan; Tünnermann, Andreas; Lebedev, Vadim; Ambacher, Oliver
High efficient terahertz emission from InN surfaces. - In: Physica status solidi, ISSN 1521-3951, Bd. 244 (2007), 6, S. 1829-1833
http://dx.doi.org/10.1002/pssb.200674893
High efficient terahertz emission from InN surfaces. - In: Physica status solidi, ISSN 1521-3951, Bd. 244 (2007), 6, S. 1829-1833
http://dx.doi.org/10.1002/pssb.200674893
Schley, Pascal; Goldhahn, Rüdiger; Winzer, Andreas T.; Gobsch, Gerhard; Cimalla, Volker; Ambacher, Oliver; Lu, Hai; Schaff, William J.; Kurouchi, M.; Nanishi, Y.; Rakel, Munise; Cobet, Christoph; Esser, Norbert
Dielectric function and Van Hove singularities for In-rich InxGa1-xN alloys: comparison of N- and metal-face materials. - In: Physical review, ISSN 1550-235X, Bd. 75 (2007), 20, S. 205204, insges. 8 S.
http://dx.doi.org/10.1103/PhysRevB.75.205204
Dielectric function and Van Hove singularities for In-rich InxGa1-xN alloys: comparison of N- and metal-face materials. - In: Physical review, ISSN 1550-235X, Bd. 75 (2007), 20, S. 205204, insges. 8 S.
http://dx.doi.org/10.1103/PhysRevB.75.205204
Wang, Chunyu; Cimalla, Volker; Romanus, Henry; Kups, Thomas; Niebelschütz, Merten; Ambacher, Oliver
Tuning of electrical and structural properties of indium oxide films grown by metal organic chemical vapor deposition. - In: Thin solid films, ISSN 1879-2731, Bd. 515 (2007), 16, S. 6611-6614
http://dx.doi.org/10.1016/j.tsf.2006.11.079
Tuning of electrical and structural properties of indium oxide films grown by metal organic chemical vapor deposition. - In: Thin solid films, ISSN 1879-2731, Bd. 515 (2007), 16, S. 6611-6614
http://dx.doi.org/10.1016/j.tsf.2006.11.079
Cimalla, Irina Nicoleta; Will, Florentina; Tonisch, Katja; Niebelschütz, Merten; Cimalla, Volker; Lebedev, Vadim; Kittler, Gabriel; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Gebinoga, Michael; Schober, Andreas; Friedrich, Thomas; Ambacher, Oliver
AlGaN/GaN biosensoreffect of device processing steps on the surface properties and biocompatibility. - In: Sensors and actuators, ISSN 0925-4005, Bd. 123 (2007), 2, S. 740-748
http://dx.doi.org/10.1016/j.snb.2006.10.030
AlGaN/GaN biosensoreffect of device processing steps on the surface properties and biocompatibility. - In: Sensors and actuators, ISSN 0925-4005, Bd. 123 (2007), 2, S. 740-748
http://dx.doi.org/10.1016/j.snb.2006.10.030
Somogyi, A.; Martinez-Criado, Gema; Homs, A.; Hernandez-Fenollosa, M. A.; Vantelon, D.; Ambacher, Oliver
Formation of Si clusters in AlGaN: a study of local structure. - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 18, S. 181129, insges. 3 S.
http://dx.doi.org/10.1063/1.2736649
Formation of Si clusters in AlGaN: a study of local structure. - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 18, S. 181129, insges. 3 S.
http://dx.doi.org/10.1063/1.2736649
Wang, Chunyu; Lebedev, Vadim; Cimalla, Volker; Kups, Thomas; Tonisch, Katja; Ambacher, Oliver
Structural studies of single crystalline In2O3 films epitaxially grown on InN(0001). - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 22, S. 221902, insges. 3 S.
http://dx.doi.org/10.1063/1.2743907
Structural studies of single crystalline In2O3 films epitaxially grown on InN(0001). - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 22, S. 221902, insges. 3 S.
http://dx.doi.org/10.1063/1.2743907
Schwarz, R.; Cabe¸ca, Ricardo; Morgado, Eduardo; Niehus, Manfred; Ambacher, Oliver; Marques, C. P.; Alves, Eduardo
Stability of GaN films under intense MeV He ion irradiation. - In: Diamond and related materials, ISSN 0925-9635, Bd. 16 (2007), 4/7, S. 1437-1440
http://dx.doi.org/10.1016/j.diamond.2007.01.017
Stability of GaN films under intense MeV He ion irradiation. - In: Diamond and related materials, ISSN 0925-9635, Bd. 16 (2007), 4/7, S. 1437-1440
http://dx.doi.org/10.1016/j.diamond.2007.01.017
Tonisch, Katja; Weise, Frank; Stubenrauch, Mike; Cimalla, Volker; Ecke, Gernot; Will, Florentina; Romanus, Henry; Mrotzek, Susanne; Hofmeister, H.; Hoffmann, Martin; Hülsenberg, Dagmar; Ambacher, Oliver
Growth of silicon nanowires on UV-structurable glass using self-organized nucleation centres. - In: Physica, ISSN 1386-9477, Bd. 38 (2007), 1/2, S. 40-43
http://dx.doi.org/10.1016/j.physe.2007.01.001
Growth of silicon nanowires on UV-structurable glass using self-organized nucleation centres. - In: Physica, ISSN 1386-9477, Bd. 38 (2007), 1/2, S. 40-43
http://dx.doi.org/10.1016/j.physe.2007.01.001
Cimalla, Volker; Lebedev, Vadim; Wang, Chunyu; Ali, Majdeddin; Ecke, Gernot; Polyakov, Vladimir M.; Schwierz, Frank; Ambacher, Oliver; Lu, Hai; Schaff, William J.
Reduced surface electron accumulation at InN films by ozone induced oxidation. - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 15, S. 152106, insges. 3 S.
http://dx.doi.org/10.1063/1.2721365
Reduced surface electron accumulation at InN films by ozone induced oxidation. - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 15, S. 152106, insges. 3 S.
http://dx.doi.org/10.1063/1.2721365