Gorelik, Tatiana; Kaiser, Ute; Kuhlmann, Thomas; Yulin, Sergey; Richter, Wolfgang
Structural characterization of ultrathin Cr and Sc films for soft X-ray mirrors. - In: Applied surface science, Bd. 230 (2004), 1/4, S. 1-7
http://dx.doi.org/10.1016/j.apsusc.2004.02.006
Structural characterization of ultrathin Cr and Sc films for soft X-ray mirrors. - In: Applied surface science, Bd. 230 (2004), 1/4, S. 1-7
http://dx.doi.org/10.1016/j.apsusc.2004.02.006
Chuvilin, Andrey; Kups, Thomas; Kaiser, Ute
The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination. - In: Journal of electron microscopy, ISSN 1477-9986, Bd. 53 (2004), 3, S. 237-244
http://dx.doi.org/10.1093/jmicro/53.3.237
The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination. - In: Journal of electron microscopy, ISSN 1477-9986, Bd. 53 (2004), 3, S. 237-244
http://dx.doi.org/10.1093/jmicro/53.3.237
Biskupek, Johannes; Kaiser, Ute
Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractograms. - In: Journal of electron microscopy, ISSN 1477-9986, Bd. 53 (2004), 6, S. 601-610
http://dx.doi.org/10.1093/jmicro/dfh088
Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractograms. - In: Journal of electron microscopy, ISSN 1477-9986, Bd. 53 (2004), 6, S. 601-610
http://dx.doi.org/10.1093/jmicro/dfh088
Cimalla, Volker; Schmidt, Alexander A.; Stauden, Thomas; Zekentes, K.; Ambacher, Oliver; Pezoldt, Jörg
Linear alignment of SiC dots on silicon substrates. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 22.2004, 5, S. L20-L23
http://dx.doi.org/10.1116/1.1787520
Linear alignment of SiC dots on silicon substrates. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 22.2004, 5, S. L20-L23
http://dx.doi.org/10.1116/1.1787520
Hotovy, Ivan; Huran, Jozef; Spieß, Lothar
Characterization of sputtered NiO films using XRD and AFM. - In: Journal of materials science, ISSN 1573-4803, Bd. 39 (2004), 7, S. 2609-2612
http://dx.doi.org/10.1023/B:JMSC.0000020040.77683.20
Characterization of sputtered NiO films using XRD and AFM. - In: Journal of materials science, ISSN 1573-4803, Bd. 39 (2004), 7, S. 2609-2612
http://dx.doi.org/10.1023/B:JMSC.0000020040.77683.20
Brundel, M.; Stubenrauch, Mike; Wurmus, Helmut; Sanchez-Ferrer, Antoni
Functional liquid-crystalline elastomers in microsystems. - In: MST news, ISSN 0948-3128, (2004), 4, S. 38-39
Functional liquid-crystalline elastomers in microsystems. - In: MST news, ISSN 0948-3128, (2004), 4, S. 38-39
Trabert, Johannes F.; Hein, Matthias A.; Müller, Jens; Perrone, Rubén A.; Stephan, Ralf; Thust, Heiko
Low-temperature co-fired ceramic microwave switch matrix for satellite communications. - In: Annual report, (2004), S. 88-89
http://www.db-thueringen.de/servlets/DocumentServlet?id=7356
Low-temperature co-fired ceramic microwave switch matrix for satellite communications. - In: Annual report, (2004), S. 88-89
http://www.db-thueringen.de/servlets/DocumentServlet?id=7356
Hülsenberg, Dagmar;
UV-unterstützte Mikrostrukturierung von Spezialglas. - In: Individuum und Kosmos, (2004), S. 257-280
UV-unterstützte Mikrostrukturierung von Spezialglas. - In: Individuum und Kosmos, (2004), S. 257-280
Martinez-Criado, Gema; Miskys, Claudio; Karrer, Uwe; Ambacher, Oliver; Stutzmann, Martin
Two-dimensional electron gas recombination in undoped AlGaN/GaN heterostructures. - In: Japanese journal of applied physics, ISSN 1347-4065, Bd. 43.2004, Pt. 1, 6A, S. 3360-3366
http://dx.doi.org/10.1143/JJAP.43.3360
Two-dimensional electron gas recombination in undoped AlGaN/GaN heterostructures. - In: Japanese journal of applied physics, ISSN 1347-4065, Bd. 43.2004, Pt. 1, 6A, S. 3360-3366
http://dx.doi.org/10.1143/JJAP.43.3360
Martins, Rodrigo; Fortunato, Elvira; Nunes, Patricia; Ferreira, Isabel; Marques, António; Bender, Marcus; Katsarakis, Nikos; Cimalla, Volker; Kiriakidis, George
Zinc oxide as an ozone sensor. - In: Journal of applied physics, ISSN 1089-7550, Bd. 96 (2004), 3, S. 1398-1408
https://doi.org/10.1063/1.1765864
Zinc oxide as an ozone sensor. - In: Journal of applied physics, ISSN 1089-7550, Bd. 96 (2004), 3, S. 1398-1408
https://doi.org/10.1063/1.1765864