Trushin, Yuri V.; Zhurkin, E. E.; Safonov, K. L.; Schmidt, Alexander A.; Kharlamov, Vladimir S.; Korolev, Sergey A.; Lubov, Maxim N.; Pezoldt, Jörg
Initial stages of the MBE growth of silicon carbide nanoclusters on a silicon substrate. - In: Technical physics letters, ISSN 1090-6533, Bd. 30 (2004), 8, S. 641-643
http://dx.doi.org/10.1134/1.1792299
Initial stages of the MBE growth of silicon carbide nanoclusters on a silicon substrate. - In: Technical physics letters, ISSN 1090-6533, Bd. 30 (2004), 8, S. 641-643
http://dx.doi.org/10.1134/1.1792299
Kosiba, Rastislav; Ecke, Gernot; Cimalla, Volker; Spieß, Lothar; Krischok, Stefan; Schäfer, Jürgen A.; Ambacher, Oliver; Schaff, William J.
Sputter depth profiling of InN layers. - In: Nuclear instruments & methods in physics research, Bd. 215 (2004), 3/4, S. 486-494
http://dx.doi.org/10.1016/j.nimb.2003.08.039
Sputter depth profiling of InN layers. - In: Nuclear instruments & methods in physics research, Bd. 215 (2004), 3/4, S. 486-494
http://dx.doi.org/10.1016/j.nimb.2003.08.039
Kosiba, Rastislav; Liday, Jozef; Ecke, Gernot; Ambacher, Oliver; Breza, Juraj
Auger electron spectroscopy of silicon carbide. - In: Journal of electrical engineering, ISSN 1335-3632, Bd. 55 (2004), 9/10, S. 269-272
Auger electron spectroscopy of silicon carbide. - In: Journal of electrical engineering, ISSN 1335-3632, Bd. 55 (2004), 9/10, S. 269-272
Pezoldt, Jörg; Zgheib, Charbel; Masri, Pierre; Averous, Michel; Morales, Francisco M.; Kosiba, Rastislav; Ecke, Gernot; Weih, Petia; Ambacher, Oliver
SIMS investigation of the influence of Ge pre-deposition on the interface quality between SiC and Si. - In: Surface and interface analysis, ISSN 0142-2421, Bd. 36 (2004), 8, S. 969-972
SIMS investigation of the influence of Ge pre-deposition on the interface quality between SiC and Si. - In: Surface and interface analysis, ISSN 0142-2421, Bd. 36 (2004), 8, S. 969-972
Chen, Guang; Jancura, Andrej; Virga, Kathleen L.; Winkler, Gert; Prince, John L.
Accurate frequency domain modeling of LTCC solid-gridded plane structures. - In: Microwave and optical technology letters, ISSN 1098-2760, Bd. 36 (2003), 5, S. 367-371
http://dx.doi.org/10.1002/mop.10766
Accurate frequency domain modeling of LTCC solid-gridded plane structures. - In: Microwave and optical technology letters, ISSN 1098-2760, Bd. 36 (2003), 5, S. 367-371
http://dx.doi.org/10.1002/mop.10766
Drakopoulos, M.; Zegenhagen, J.; Lee, T.-L.; Snigirev, A.; Snigireva, I.; Cimalla, Volker; Ambacher, Oliver
GaN polarity domains spatially resolved by x-ray standing wave microscopy. - In: Journal of physics, ISSN 1361-6463, Bd. 36 (2003), 10A, S. A214-A216
https://doi.org/10.1088/0022-3727/36/10A/344
GaN polarity domains spatially resolved by x-ray standing wave microscopy. - In: Journal of physics, ISSN 1361-6463, Bd. 36 (2003), 10A, S. A214-A216
https://doi.org/10.1088/0022-3727/36/10A/344
Hotovy, Ivan; Liday, Jozef; Spieß, Lothar; Sitter, Helmut; Vogrincic, Peter
Study of annealed NiO thin films sputtered on unheated substrate. - In: Japanese journal of applied physics, ISSN 1347-4065, Bd. 42.2003, Pt. 2, 10A, S. L1178-L1181
http://dx.doi.org/10.1143/JJAP.42.L1178
Study of annealed NiO thin films sputtered on unheated substrate. - In: Japanese journal of applied physics, ISSN 1347-4065, Bd. 42.2003, Pt. 2, 10A, S. L1178-L1181
http://dx.doi.org/10.1143/JJAP.42.L1178
Bender, Marcus; Fortunato, Elvira; Nunes, Patricia; Ferreira, Isabel; Marques, António; Martins, Rodrigo; Katsarakis, Nikos; Cimalla, Volker; Kiriakidis, George
Highly sensitive ZnO ozone detectors at room temperature. - In: Japanese journal of applied physics, ISSN 1347-4065, Bd. 42.2003, Pt. 2, 4B, S. L435-L437
http://dx.doi.org/10.1143/JJAP.42.L435
Highly sensitive ZnO ozone detectors at room temperature. - In: Japanese journal of applied physics, ISSN 1347-4065, Bd. 42.2003, Pt. 2, 4B, S. L435-L437
http://dx.doi.org/10.1143/JJAP.42.L435
Aperathitis, Elias; Bender, Marcus; Cimalla, Volker; Ecke, Gernot; Modreanu, Mircea
Properties of rf-sputtered indiumtin-oxynitride thin films. - In: Journal of applied physics, ISSN 1089-7550, Bd. 94 (2003), 2, S. 1258-1266
https://doi.org/10.1063/1.1582368
Properties of rf-sputtered indiumtin-oxynitride thin films. - In: Journal of applied physics, ISSN 1089-7550, Bd. 94 (2003), 2, S. 1258-1266
https://doi.org/10.1063/1.1582368
Katsarakis, Nikos; Bender, Marcus; Cimalla, Volker; Gagaoudakis, E.; Kiriakidis, George
Ozone sensing properties of DC-sputtered, c-axis oriented ZnO films at room temperature. - In: Sensors and actuators, ISSN 0925-4005, Bd. 96 (2003), 1/2, S. 76-81
http://dx.doi.org/10.1016/S0925-4005(03)00488-X
Ozone sensing properties of DC-sputtered, c-axis oriented ZnO films at room temperature. - In: Sensors and actuators, ISSN 0925-4005, Bd. 96 (2003), 1/2, S. 76-81
http://dx.doi.org/10.1016/S0925-4005(03)00488-X