Zeitschriftenaufsätze

The Josephson comparator is one of the fundamental building blocks of rapid single flux quantum (RSFQ) electronics. Within this circuit family it is the exclusive device which provides logical data processing. The Josephson comparator is also the basic decision element for very fast analog-to-digital converters and sampler circuits for low input power and high-bandwidth signals based on the RSFQ technique. The performance of those devices is fundamentally determined by the characteristics of the Josephson comparator. In this study the gray zone dependency on the clock frequency of a Josephson comparator is investigated by simulations concerning the influence of thermal noise. This investigation is performed for a series of operating points defined by the bias current and different noise levels defined by the operating temperature. In contrast to former investigations, we analyzed the comparator embedded in a realistic environment for output data processing. We identified a characteristic clock frequency fc for a comparator topology designed for a 1 kA cm - 2 niobium fabrication technology. The gray zone of 8 A remains constant for clock frequencies below fc = 15 GHz and starts to increase for larger frequencies. We also found out that this characteristic frequency is independent of the intensity of thermal noise and therefore independent of temperature.

In this study, we report on our simulation and experimental results for quasi-one junction SQUIDs (QOS) comparator targeted to be used in the front-end of the detector read-out circuits. The QOS is used as a 1-bit quantizer in the front-end of the read-out circuit. Their performance and reliability is very much depending on the circuit parameters of the QOSs. The main design parameters are the threshold level, gray zone width, and the chip-to-chip reproducibility over different fabrication batches. For some special applications, such as detector readout, the overall power consumption needs to be sufficient small. We measured threshold and gray zone counting each individual switching event for various bias and input current values and for different QOS designs. In addition, circuit simulations including thermal noise are used to explain the observed circuit behavior and to optimize design parameters.