Wang, Chunyu; Cimalla, Volker; Kups, Thomas; Röhlig, Claus-Christian; Romanus, Henry; Lebedev, Vadim; Pezoldt, Jörg; Stauden, Thomas; Ambacher, Oliver
Photoreduction and oxidation behavior of In2O3 nanoparticles by metal organic chemical vapor deposition. - In: Journal of applied physics, ISSN 1089-7550, Bd. 102 (2007), 4, 044310, insges. 6 S.
https://doi.org/10.1063/1.2770831
Photoreduction and oxidation behavior of In2O3 nanoparticles by metal organic chemical vapor deposition. - In: Journal of applied physics, ISSN 1089-7550, Bd. 102 (2007), 4, 044310, insges. 6 S.
https://doi.org/10.1063/1.2770831
Pezoldt, Jörg; Förster, Christian; Cimalla, Volker; Will, Florentina; Stephan, Ralf; Brückner, Klemens; Hein, Matthias; Ambacher, Oliver
FTIR ellipsometry analysis of the internal stress in SiC/Si MEMS. - In: Silicon carbide and related materials 2006, (2007), S. 363-366
FTIR ellipsometry analysis of the internal stress in SiC/Si MEMS. - In: Silicon carbide and related materials 2006, (2007), S. 363-366
Pezoldt, Jörg; Förster, Christian; Stauden, Thomas; Cimalla, Volker; Morales, Francisco M.; Zgheib, Charbel; Masri, Pierre; Ambacher, Oliver
Morphology and stress control in UHVCVD of 3C-SiC(100) on Si. - In: Silicon carbide and related materials 2006, (2007), S. 203-206
Morphology and stress control in UHVCVD of 3C-SiC(100) on Si. - In: Silicon carbide and related materials 2006, (2007), S. 203-206
Machleidt, Torsten; Franke, Karl-Heinz; Romanus, Henry; Cimalla, Volker; Niebelschütz, Merten; Spieß, Lothar; Ambacher, Oliver
Using defined structures on very thin foils for characterizing AFM tips. - In: Ultramicroscopy, ISSN 1879-2723, Bd. 107 (2007), 10/11, S. 1086-1090
http://dx.doi.org/10.1016/j.ultramic.2007.05.004
Using defined structures on very thin foils for characterizing AFM tips. - In: Ultramicroscopy, ISSN 1879-2723, Bd. 107 (2007), 10/11, S. 1086-1090
http://dx.doi.org/10.1016/j.ultramic.2007.05.004
Cimalla, Volker; Machleidt, Torsten; Spieß, Lothar; Gubisch, Maik; Hotovy, Ivan; Romanus, Henry; Ambacher, Oliver
Analysis of nanocrystalline films on rough substrates. - In: Ultramicroscopy, ISSN 1879-2723, Bd. 107 (2007), 10/11, S. 989-994
http://dx.doi.org/10.1016/j.ultramic.2007.02.046
Analysis of nanocrystalline films on rough substrates. - In: Ultramicroscopy, ISSN 1879-2723, Bd. 107 (2007), 10/11, S. 989-994
http://dx.doi.org/10.1016/j.ultramic.2007.02.046
Himmerlich, Marcel; Krischok, Stefan; Lebedev, Vadim; Ambacher, Oliver; Schäfer, Jürgen A.; Ambacher, Oliver
Morphology and surface electronic structure of MBE grown InN. - In: Journal of crystal growth, Bd. 306 (2007), 1, S. 6-11
http://dx.doi.org/10.1016/j.jcrysgro.2007.04.014
Morphology and surface electronic structure of MBE grown InN. - In: Journal of crystal growth, Bd. 306 (2007), 1, S. 6-11
http://dx.doi.org/10.1016/j.jcrysgro.2007.04.014
Calleja, E.; Grandal, J.; Sánchez-García, M. A.; Niebelschütz, Merten; Cimalla, Volker; Ambacher, Oliver
Evidence of electron accumulation at nonpolar surfaces of InN nanocolumns. - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 26, S. 262110, insges. 3 S.
http://dx.doi.org/10.1063/1.2749871
Evidence of electron accumulation at nonpolar surfaces of InN nanocolumns. - In: Applied physics letters, ISSN 1077-3118, Bd. 90 (2007), 26, S. 262110, insges. 3 S.
http://dx.doi.org/10.1063/1.2749871
Lebedev, Vadim; Wang, Chunyu; Cimalla, Volker; Hauguth, Sindy; Kups, Thomas; Ali, Majdeddin; Ecke, Gernot; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Ambacher, Oliver; Polyakov, Vladimir M.; Schwierz, Frank
Effect of surface oxidation on electron transport in InN thin films. - In: Journal of applied physics, ISSN 1089-7550, Bd. 101 (2007), 12, 123705, insges. 6 S.
https://doi.org/10.1063/1.2747592
Effect of surface oxidation on electron transport in InN thin films. - In: Journal of applied physics, ISSN 1089-7550, Bd. 101 (2007), 12, 123705, insges. 6 S.
https://doi.org/10.1063/1.2747592
Ali, Majdeddin; Cimalla, Volker; Lebedev, Vadim; Stauden, Thomas; Wang, Chunyu; Ecke, Gernot; Tilak, Vinayak; Sandvik, Peter; Ambacher, Oliver
Reactively sputtered InxVyOz films for detection of NOx, D2, and O2. - In: Sensors and actuators, ISSN 0925-4005, Bd. 123 (2007), 2, S. 779-783
http://dx.doi.org/10.1016/j.snb.2006.10.018
Reactively sputtered InxVyOz films for detection of NOx, D2, and O2. - In: Sensors and actuators, ISSN 0925-4005, Bd. 123 (2007), 2, S. 779-783
http://dx.doi.org/10.1016/j.snb.2006.10.018
Liday, Jozef; Hotovy, Ivan; Sitter, Helmut; Schmidegg, K.; Vogrincic, Peter; Bonnani, A.; Breza, Juraj; Ecke, Gernot; Vávra, I.
Auger electron spectroscopy of Au/NiOx contacts on p-GaN annealed in N2 and O2 + N2 ambients. - In: Applied surface science, Bd. 253 (2007), 6, S. 3174-3180
http://dx.doi.org/10.1016/j.apsusc.2006.07.011
Auger electron spectroscopy of Au/NiOx contacts on p-GaN annealed in N2 and O2 + N2 ambients. - In: Applied surface science, Bd. 253 (2007), 6, S. 3174-3180
http://dx.doi.org/10.1016/j.apsusc.2006.07.011