Niebelschütz, Florentina; Tonisch, Katja; Cimalla, Volker; Brückner, Klemens; Stephan, Ralf; Hein, Matthias; Schober, Andreas; Ambacher, Oliver
Resonant sensors for microfluidic applications. - In: Nanofunctional materials, nanostructures, and novel devices for biological and chemical detection, ISBN 978-1-60423-407-7, (2006), S. 149-154
Resonant sensors for microfluidic applications. - In: Nanofunctional materials, nanostructures, and novel devices for biological and chemical detection, ISBN 978-1-60423-407-7, (2006), S. 149-154
Cherkashinin, Genady; Lebedev, Vadim; Wagner, Roland; Cimalla, Irina; Ambacher, Oliver
The performance of AlGaN solar blind UV photodetectors : responsivity and decay time. - In: Physica status solidi, ISSN 1521-3951, Bd. 243 (2006), 7, S. 1713-1717
http://dx.doi.org/10.1002/pssb.200565213
The performance of AlGaN solar blind UV photodetectors : responsivity and decay time. - In: Physica status solidi, ISSN 1521-3951, Bd. 243 (2006), 7, S. 1713-1717
http://dx.doi.org/10.1002/pssb.200565213
Huran, Jozef; Zatko, B.; Hotovy, Ivan; Pezoldt, Jörg; Kobzev, A. P.; Balalykin, N. I.
PECVD silicon carbide deposited at different temperature. - In: Czechoslovak journal of physics, ISSN 1572-9486, Bd. 56.2006, Suppl. 2, S. B1207-B1211
http://dx.doi.org/10.1007/s10582-006-0351-8
PECVD silicon carbide deposited at different temperature. - In: Czechoslovak journal of physics, ISSN 1572-9486, Bd. 56.2006, Suppl. 2, S. B1207-B1211
http://dx.doi.org/10.1007/s10582-006-0351-8
Wang, Chunyu; Cimalla, Volker; Röhlig, Claus-Christian; Stauden, Thomas; Niebelschütz, Florentina; Ambacher, Oliver; Kiesewetter, Olaf; Kittelmann, S.
A new type of highly sensitive portable ozone sensor operating at room temperature. - In: 2006 IEEE sensors, (2006), S. 81-84
A new type of highly sensitive portable ozone sensor operating at room temperature. - In: 2006 IEEE sensors, (2006), S. 81-84
Schober, Andreas;
Weise, Frank; Cimalla, Irina Nicoleta; Gebinoga, Michael; Fischer, Michael; Lilienthal, Katharina; Kremin, Christoph; Lübbers, Benedikt; Kittler, Gabriel; Ambacher, Oliver; Friedrich, Thomas
Neuartige Sensoren für nano- und pikofluidische Systeme in biotechnischen Anwendungen. - In: Technische Systeme für Biotechnologie und Umwelt, (2006), S. 141-147
Neuartige Sensoren für nano- und pikofluidische Systeme in biotechnischen Anwendungen. - In: Technische Systeme für Biotechnologie und Umwelt, (2006), S. 141-147
Cherkashinin, Genady; Krischok, Stefan; Himmerlich, Marcel; Ambacher, Oliver; Schäfer, Jürgen A.
Electronic properties of C 60 /InP(0 0 1) heterostructures. - In: Journal of physics. Condensed matter. - Bristol : IOP Publ., 1989- , ISSN: 1361-648X , ZDB-ID: 1472968-4, ISSN 1361-648X, Bd. 18 (2006), 43, S. 9841-9848
http://dx.doi.org/10.1088/0953-8984/18/43/006
Electronic properties of C 60 /InP(0 0 1) heterostructures. - In: Journal of physics. Condensed matter. - Bristol : IOP Publ., 1989- , ISSN: 1361-648X , ZDB-ID: 1472968-4, ISSN 1361-648X, Bd. 18 (2006), 43, S. 9841-9848
http://dx.doi.org/10.1088/0953-8984/18/43/006
Brückner, Klemens; Will, Florentina; Tonisch, Katja; Cimalla, Volker; Ambacher, Oliver; Stephan, Ralf; Hein, Matthias A.
Systematic study of the RF properties of micro-electromechanical RF resonators for sensor applications. - In: The 17th MicroMechanics Europe Workshop, MME'06, (2006), S. 13-16
Systematic study of the RF properties of micro-electromechanical RF resonators for sensor applications. - In: The 17th MicroMechanics Europe Workshop, MME'06, (2006), S. 13-16
Cimalla, Volker; Niebelschütz, Merten; Ecke, Gernot; Lebedev, Vadim; Ambacher, Oliver; Himmerlich, Marcel; Krischok, Stefan; Schäfer, Jürgen A.; Lu, Hai; Schaff, William J.
Surface band bending at nominally undoped and Mg-doped InN by Auger Electron Spectroscopy. - In: Physica status solidi, ISSN 1862-6319, Bd. 203 (2006), 1, S. 59-65
http://dx.doi.org/10.1002/pssa.200563505
Surface band bending at nominally undoped and Mg-doped InN by Auger Electron Spectroscopy. - In: Physica status solidi, ISSN 1862-6319, Bd. 203 (2006), 1, S. 59-65
http://dx.doi.org/10.1002/pssa.200563505
Ecke, Gernot; Niebelschütz, Merten; Kosiba, Rastislav; Rossow, Uwe; Cimalla, Volker; Liday, Jozef; Vogrinčič, Peter; Pezoldt, Jörg; Lebedev, Vadim; Ambacher, Oliver
Fermi level analysis of group III nitride semiconductor device structures by Auger peak position measurements. - In: Journal of electrical engineering, ISSN 1335-3632, Bd. 57 (2006), 6, S. 354-359
Fermi level analysis of group III nitride semiconductor device structures by Auger peak position measurements. - In: Journal of electrical engineering, ISSN 1335-3632, Bd. 57 (2006), 6, S. 354-359
Hotovy, Ivan; Huran, Jozef; Spieß, Lothar; Romanus, Henry; Buc, D.; Kosiba, Rastislav
NiO-based nanostructured thin films with Pt surface modification for gas detection. - In: Thin solid films, ISSN 1879-2731, Bd. 515 (2006), 2, S. 658-661
http://dx.doi.org/10.1016/j.tsf.2005.12.232
NiO-based nanostructured thin films with Pt surface modification for gas detection. - In: Thin solid films, ISSN 1879-2731, Bd. 515 (2006), 2, S. 658-661
http://dx.doi.org/10.1016/j.tsf.2005.12.232