Schadewald, Uwe; Halbedel, Bernd; Ziolkowski, Marek; Brauer, Hartmut
The manipulation of paramagnetic ions by magnetic field gradient forces. - In: Proceedings of the 6th International Scientific Colloquium Modelling for Material Processing, ISBN 978-9984-45-223-4, (2010), S. 127-132
The manipulation of paramagnetic ions by magnetic field gradient forces. - In: Proceedings of the 6th International Scientific Colloquium Modelling for Material Processing, ISBN 978-9984-45-223-4, (2010), S. 127-132
Geza, Vadims; Krieger, Uwe; Jakovics, Andris; Halbedel, Bernd
Influence of material properties on the electromagnetic homogenization of glass melt in the special melter. - In: Proceedings of the 6th International Scientific Colloquium Modelling for Material Processing, ISBN 978-9984-45-223-4, (2010), S. 115-120
Influence of material properties on the electromagnetic homogenization of glass melt in the special melter. - In: Proceedings of the 6th International Scientific Colloquium Modelling for Material Processing, ISBN 978-9984-45-223-4, (2010), S. 115-120
Kosc, Ivan; Hotovy, Ivan; Kompitsas, Michael; Grieseler, Rolf; Wilke, Marcus; Rehacek, Vlastimil; Predanocy, Martin; Kups, Thomas; Spieß, Lothar
The compound oxides based on TiO2 and NiO thin films for low temperature gas detection. - In: 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), 2010, ISBN 978-1-4244-8572-7, (2010), S. 337-340
http://dx.doi.org/10.1109/ASDAM.2010.5666355
The compound oxides based on TiO2 and NiO thin films for low temperature gas detection. - In: 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), 2010, ISBN 978-1-4244-8572-7, (2010), S. 337-340
http://dx.doi.org/10.1109/ASDAM.2010.5666355
Predanocy, Martin; Fasaki, I.; Wilke, Marcus; Hotovy, Ivan; Kosc, Ivan; Spieß, Lothar
Study of optical and electrical properties of sputtered indium oxide films. - In: 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), 2010, ISBN 978-1-4244-8572-7, (2010), S. 297-300
http://dx.doi.org/10.1109/ASDAM.2010.5667003
Study of optical and electrical properties of sputtered indium oxide films. - In: 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), 2010, ISBN 978-1-4244-8572-7, (2010), S. 297-300
http://dx.doi.org/10.1109/ASDAM.2010.5667003
Novotný, Ivan; Kotorová, D.; Flickyngerová, Sona; Tvarožek, Vladimir; Spiess, Lothar; Schaaf, Peter; Netrvalová, Marie; Šutta, Pavol
Effect of substrate temperature on oblique-angle sputtered ZnO:Ga thin films. - In: 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), 2010, ISBN 978-1-4244-8572-7, (2010), S. 73-76
http://dx.doi.org/10.1109/ASDAM.2010.5666346
Effect of substrate temperature on oblique-angle sputtered ZnO:Ga thin films. - In: 8th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM), 2010, ISBN 978-1-4244-8572-7, (2010), S. 73-76
http://dx.doi.org/10.1109/ASDAM.2010.5666346
Wilden, Johannes; Drescher, Viktor E.; Schaaf, Peter; Günschmann, Sabine
Composite coatings with drag reduction and self-cleaning properties. - In: Conference proceedings, (2010), insges. 5 S.
Composite coatings with drag reduction and self-cleaning properties. - In: Conference proceedings, (2010), insges. 5 S.
Hofer, Manuel; Stauden, Thomas; Kouakouo Nomvussi, Serge Ayme; Pezoldt, Jörg; Rangelow, Ivo W.
Silizium-Nanoresonatoren. - In: Sensoren und Messsysteme 2010, (2010), S. 330-333
Silizium-Nanoresonatoren. - In: Sensoren und Messsysteme 2010, (2010), S. 330-333
Pätz, Daniel; Leopold, Steffen; Knöbber, Fabian; Sinzinger, Stefan; Hoffmann, Martin; Ambacher, Oliver
Tunable compound eye cameras. - In: Micro-optics 2010, ISBN 978-0-8194-8189-4, 2010, 77160K, insges. 7 S.
Tunable compound eye cameras. - In: Micro-optics 2010, ISBN 978-0-8194-8189-4, 2010, 77160K, insges. 7 S.
Lüdtke, Ulrich; Kelm, André; Halbedel, Bernd; Krieger, Uwe
Numerische Simulation der Strömungsbeeinflussung einer Glasschmelze mit Hilfe von Lorentzkräften. - In: Workshop Elektroprozesstechnik, (2010), 13, insges. 9 S.
Numerische Simulation der Strömungsbeeinflussung einer Glasschmelze mit Hilfe von Lorentzkräften. - In: Workshop Elektroprozesstechnik, (2010), 13, insges. 9 S.
Halbedel, Bernd; Krieger, Uwe; Geza, Vadim; Jakovics, Andris; Iser, Ronald
Elektromagnetische Strömungsbeeinflussung in einer Spezialschmelzenanlage : Prinzip, Auslegung und Ergebnisse. - In: Workshop Elektroprozesstechnik, (2010), 6, insges. 15 S.
Elektromagnetische Strömungsbeeinflussung in einer Spezialschmelzenanlage : Prinzip, Auslegung und Ergebnisse. - In: Workshop Elektroprozesstechnik, (2010), 6, insges. 15 S.