Measurement uncertainty consideration in the case of nonlinear models for precision length measurement. - In: 2014 Joint IMEKO TC1-TC7-TC13 Symposium: Measurement Science Behind Safety and Security, (2015), 012033, insges. 6 S.
The requirements on the precision lengths and precision load measurement rise due to the rapid technical development, in particular of nanotechnologies and precision optics. According to the roadmap "Dimensional metrology for micro- and nanotechnology" of the European National Metrology Institutes (iMERA)2 in the next few years "traceable 2D (3D) metrology at (sub)-nm accuracy over several 100 mm range" will be required.
http://dx.doi.org/10.1088/1742-6596/588/1/012033
Stan ta perspektivi rozvitku kompьjuterizovanich sistem kontrolju topologii poverchni :
State and prospects of computerized systems monitoring the topology of surfaces, based on white light interferometry. - In: Computational problems of electrical engineering, ISSN 2309-4834, Bd. 4 (2014), 1, S. 75-80
This paper describes a computerized system for object topology control based on a white light interferometer. The theoretical fundamentals of white light interferometry and mathematical model of an interferogram are presented. An overview and comparative analysis of methods for the reconstruction of the topology of surfaces based on a white light interferogram are performed, their main advantages and disadvantages are defined, and the objectives for the development of computerized systems are formulated.
http://ena.lp.edu.ua:8080/xmlui/handle/ntb/26620
Versatile applications of laser focus probes in precision measurement technology. - In: 11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry (LMPMI 2014), ISBN 978-1-63266-731-1, (2014), S. 29-34
Filterung von Messdaten in der Form- und Oberflächenmesstechnik. - VI, 143 S. Ilmenau : Techn. Univ., Habil.-Schr., 2014
Lorentz force velocimetry using electromagnetic force compensated load cells. - In: 22nd IMEKO TC3 International Conference on Measurement of Force, Mass and Torque 2014, ISBN 978-1-63266-728-1, (2014), S. 44-47
This paper discusses the flow rate measurement of poorly conducting fluids (such as electrolytes) using Lorentz force velocimetry (short: LFV). The Lorentz force caused by the moving electrolytes is in the range of micronewton. This tiny Lorentz force is determined using a high resolution force measurement systems based on electromagnetic force compensated (short: EMC) load cells. In this paper the force measurement system, the principle of LFV and the environmental influences on this kind of force measurement system are described.
Precise tiltmeter and inclinometer based on commercial force compensation weigh cells. - In: 22nd IMEKO TC3 International Conference on Measurement of Force, Mass and Torque 2014, ISBN 978-1-63266-728-1, (2014), S. 48-51
High precision measurements and monitoring of tilt or inclination are essential in the field of ultraprecise force and mass measurements. We present a new concept for high resolving tilt/ inclination measurements. Therefore a commercial electromagnetic force compensation (EMC) weigh cell is mounted in a hanging position and loaded with a defined weight. Thus the system conforms to a pendulum. By measuring the tilt depended deflection of the pendulum with the position sensor of the weigh cell we achieved a standard deviation of 7.1 nrad (3.4 nrad filtered) within a sampling time of 15 min. In future investigations we will compensate the deflection and take the compensation force as a measure for the tilt.
Direct Lorentz force compensation flowmeter for electrolytes. - In: Applied physics letters, ISSN 1077-3118, Bd. 105 (2014), 22, S. 223510, insges. 4 S.
http://dx.doi.org/10.1063/1.4903235
Entwicklung von Normalen für die Charakterisierung von Asphären-Messgeräten. - In: DGaO-Proceedings, ISSN 1614-8436, Bd. 115.2014, A31, insges. 2 S.
Zur Charakterisierung optischer und taktiler Asphären-Messgeräte sind Oberflächen notwendig, deren Formen weitestgehend bekannt sind. Dazu werden zum einen Normale mit typischen asphärischen Oberflächenanteilen verwendet. Zur Charakterisierung wichtiger Eigenschaften der Messgeräte werden Normale mit zusätzlichen Formanteilen benötigt.
http://www.db-thueringen.de/servlets/DocumentServlet?id=25316
Reduction of thermal effects on precise dimensional measurements. - In: Shaping the future by engineering, (2014), insges. 8 S.
http://nbn-resolving.de/urn:nbn:de:gbv:ilm1-2014iwk-168:3
Hyper- and multispectral imaging systems - a survey of different approaches at the Ilmenau University of Technology. - In: Shaping the future by engineering, (2014), insges. 11 S.
http://nbn-resolving.de/urn:nbn:de:gbv:ilm1-2014iwk-087:3