Dry block calibrator using heat flux sensors and an adiabatic shield :
Metall-Blockkalibrator mit Wärmestromsensoren und adiabatischem Schild. - In: Sensoren und Messsysteme 2014, (2014), insges. 6 S.
Untersuchung thermo-mechanischer Belastungen in Abgassystemen bei hochdynamischer Druckpulsation. - In: Sensoren und Messsysteme 2014, (2014), insges. 6 S.
Highly precise temperature measurement at ambient temperature :
Hochpräzise Temperaturmessung im Raumtemperaturbereich. - In: Sensoren und Messsysteme 2014, (2014), insges. 4 S.
Neufassung der VDI/VDE-Richtlinie 3522 "Zeitverhalten von Berührungsthermometern". - In: Sensoren und Messsysteme 2014, (2014), insges. 6 S.
Parameterization and optimisation of EMC balances based on the frequency response of the impedance. - In: Measurement, Bd. 51 (2014), S. 349-355
http://dx.doi.org/10.1016/j.measurement.2014.01.032
Determination of force to displacement curves using a nanopositioning system based on electromagnetic force compensated balances. - In: Measurement, Bd. 51 (2014), S. 343-348
http://dx.doi.org/10.1016/j.measurement.2014.02.034
Traceable measurement of mechanical parameters of double bending beam force transducers according to EN ISO 376. - In: Measurement, Bd. 51 (2014), S. 336-342
http://dx.doi.org/10.1016/j.measurement.2014.02.024
Dynamic properties of contact thermometers for high temperatures. - In: Measurement, Bd. 51 (2014), S. 387-392
Temperature sensors used in exhaust systems of combustion engines have to measure enormous temperature differences within the shortest periods of time. This serves to protect the engine parts with respect to their temperature stability and to govern the energy efficient operation of the engine. Numerical calculations with the Finite Elements Method are used to estimate static-thermal measurement errors and dynamic characteristics primarily concerning medium specificity and construction of the temperature sensors. New test equipment requires comparing various thermometers under real conditions (high temperature steps and velocity). Prediction models are used to correct the dynamic behavior and to predict the fluid temperature faster accurately.
http://dx.doi.org/10.1016/j.measurement.2013.11.021
Interferometer-based scanning probe microscope for high-speed, long-range, traceable measurements. - In: Pomiary, automatyka, kontrola, ISSN 0032-4140, Bd. 60 (2014), 2, S. 69-72
The specialty of the metrological SPM-head is the combined deflection detection system for simultaneous acquisition of bending, torsion and position of the cantilever with one measuring beam. The deflection system comprises a beam deflection and an interferometer in such a way that measurements of the cantilever displacement are traceable to the SI unit metre. Integrated into a NPM machine scans with a Resolution of 0.1 nm over a range of 25 mm × 25 mm are possible.
Multifunctional nanoanalytics and long-range scanning probe microscope using a nanopositioning and nanomeasuring machine. - In: Measurement science and technology, ISSN 1361-6501, Bd. 25 (2014), 4, S. 044006, insges. 7 S.
An interferometer-based metrological scanning probe microscope (SPM) is successfully integrated into our nanopositioning and nanomeasuring machine (NPM machine) for high-precision measurements with nanometre uncertainty over a range of 25 mm × 25 mm × 5 mm. Both devices were developed at the Institute of Process Measurement and Sensor Technology of Ilmenau University of Technology, Germany. Outstanding results were achieved for different measurement tasks. With the NPM machine, truly long-range and long-term measurements are possible. Due to the tip wear, an automatic SPM cantilever replacement is preferable. Such a tip replacement is also required for the integration of multifunctional nanoanalytics. For example, for Kelvin probe force microscopy (KPFM), the measurement of topography and surface potential with different SPM tips is necessary. For this purpose, an electromagnetic tip changer was designed. The tip changer comprises three SPM probes. In order to retrieve the previous tip positions, additional fiducial marks were developed. The repeatability of relocation is less than 10 nm. The automatic tip changer and fiducial marks are integrated into a sample holder. The tip changer in combination with fiducial marks allows scanning distances three times longer (with the same type of SPM probes) and multifunctional nanoanalytics (with different SPM probes with special properties). Sample KPFM measurements are demonstrated. The developed tip changer, including special fiducial marks, improves the performance and functionality of the NPM machine crucially.
http://dx.doi.org/10.1088/0957-0233/25/4/044006