Belau, Stefan; Halbedel, Bernd; Hülsenberg, Dagmar
High coercive barium hexaferrite powders by partial Ba2+- and Fe3+-substitution for magnetic sensor applications. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 10 S.
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High coercive barium hexaferrite powders by partial Ba2+- and Fe3+-substitution for magnetic sensor applications. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 10 S.
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Schadewald, Uwe; Halbedel, Bernd; Romanus, Henry; Hülsenberg, Dagmar
New results of the crystallization behaviour of hexagonal barium ferrites from a glassy matrix. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 8 S.
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New results of the crystallization behaviour of hexagonal barium ferrites from a glassy matrix. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 8 S.
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Dzur, Birger; Thomas, Georg; Linke, Peter
IC-plasma sprayed Nd-Fe-B-coatings for applications in electrodynamic microactor systems. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 7 S.
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IC-plasma sprayed Nd-Fe-B-coatings for applications in electrodynamic microactor systems. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 7 S.
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Niebelschütz, Merten; Ecke, Gernot; Cimalla, Volker; Tonisch, Katja; Ambacher, Oliver
Work function analysis of GaN-based lateral polarity structures by Auger electron energy measurements. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.
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Work function analysis of GaN-based lateral polarity structures by Auger electron energy measurements. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.
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Cimalla, Irina; Will, Florentina; Tonisch, Katja; Lebedev, Vadim; Niebelschütz, Merten; Himmerlich, Marcel; Krischok, Stefan; Cimalla, Volker; Kittler, Gabriel; Kremin, Christoph
Impact of device processing on the surface properties and the biocompatibility of AlGaN/GaN HEMT sensors. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.
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Impact of device processing on the surface properties and the biocompatibility of AlGaN/GaN HEMT sensors. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.
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Cimalla, Volker; Lebedev, Vadim; Morales, Francisco M.; Niebelschütz, Merten; Ecke, Gernot; Goldhahn, Rüdiger; Ambacher, Oliver
Origin of n-type conductivity in nominally undoped InN. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.
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Origin of n-type conductivity in nominally undoped InN. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.
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Kulikov, Dimitrii V.; Schmidt, Alexander A.; Korolev, Sergey A.; Morales, Francisco M.; Stauden, Thomas; Pezoldt, Jörg; Trushin, Yuri V.
Simulation of quality of SiC/Si interface during MBE deposition of C on Si. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 9 S.
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Simulation of quality of SiC/Si interface during MBE deposition of C on Si. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 9 S.
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Flickyngerova, Sona; Novotny, Ivan; Tvarozek, Vladimir; Nigrovicova, Martina; Satka, Alexander; Kovac, Jaroslav; Sutta, Pavel; Breternitz, Volkmar; Spieß, Lothar; Knedlik, Christian
Zinc oxide - unique material for micro-/nanotechnology. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 11 S.
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Zinc oxide - unique material for micro-/nanotechnology. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 11 S.
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Wang, Chunyu; Cimalla, Volker; Ambacher, Oliver
Tuning of electrical properties of InxOy thin films grown by MOCVD for different applications. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.
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Tuning of electrical properties of InxOy thin films grown by MOCVD for different applications. - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 2 S.
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Wilke, Marcus; Analytis, Minas; Breternitz, Volkmar; Knedlik, Christian; Teichert, Gerd
Recalibration-free measurement of the compound layer thickness of nitrocarburized samples by glow discharge optical emission spectrometry (GD-OES). - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 4 S.
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Recalibration-free measurement of the compound layer thickness of nitrocarburized samples by glow discharge optical emission spectrometry (GD-OES). - In: Information technology and electrical engineering - devices and systems, materials and technologies for the future, (2006), insges. 4 S.
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