Scherge, Matthias; Schäfer, Jürgen A.
Mikro- und Makrotribologie - ähnliche Erscheinungen, unterschiedliche Ursachen?. - In: Tribologie und Schmierungstechnik, ISSN 0724-3472, Bd. 47 (2000), 2, S. 7-10
Mikro- und Makrotribologie - ähnliche Erscheinungen, unterschiedliche Ursachen?. - In: Tribologie und Schmierungstechnik, ISSN 0724-3472, Bd. 47 (2000), 2, S. 7-10
Wöhner, Thomas; Cimalla, Volker; Stauden, Thomas; Schäfer, Jürgen A.; Pezoldt, Jörg
Real time spectroscopic ellipsometry monitoring of the SiC growth during the interaction process of elemental carbon with Si surfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 364 (2000), 1/2, S. 28-32
https://doi.org/10.1016/S0040-6090(99)00918-9
Real time spectroscopic ellipsometry monitoring of the SiC growth during the interaction process of elemental carbon with Si surfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 364 (2000), 1/2, S. 28-32
https://doi.org/10.1016/S0040-6090(99)00918-9
Liu, Huiwen; Fujisawa, Satoru; Tanaka, Akihiro; Enomoto, Yuji
Controlling and improving the microtribological properties of Langmuir-Blodgett monolayer films using an external electric field. - In: Thin solid films, ISSN 1879-2731, Bd. 368 (2000), 1, S. 135-142
https://doi.org/10.1016/S0040-6090(00)00733-1
Controlling and improving the microtribological properties of Langmuir-Blodgett monolayer films using an external electric field. - In: Thin solid films, ISSN 1879-2731, Bd. 368 (2000), 1, S. 135-142
https://doi.org/10.1016/S0040-6090(00)00733-1
Starke, Ulrich; Sloboshanin, Sergej; Tautz, Frank Stefan; Seubert, A.; Schäfer, Jürgen A.
Polarity, morphology and reactivity of epitaxial GaN films on Al 2 O 3 (0001). - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 177 (2000), 1, S. 5-14
http://dx.doi.org/10.1002/(SICI)1521-396X(200001)177:1<5::AID-PSSA5>3.0.CO;2-K
Polarity, morphology and reactivity of epitaxial GaN films on Al 2 O 3 (0001). - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 177 (2000), 1, S. 5-14
http://dx.doi.org/10.1002/(SICI)1521-396X(200001)177:1<5::AID-PSSA5>3.0.CO;2-K
Rossow, Uwe; Aspnes, David E.
Characterization of Al x Ga 1-x N-compound layers by reflectance difference spectroscopy. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 177 (2000), 1, S. 157-164
http://dx.doi.org/10.1002/(SICI)1521-396X(200001)177:1<157::AID-PSSA157>3.0.CO;2-P
Characterization of Al x Ga 1-x N-compound layers by reflectance difference spectroscopy. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 177 (2000), 1, S. 157-164
http://dx.doi.org/10.1002/(SICI)1521-396X(200001)177:1<157::AID-PSSA157>3.0.CO;2-P
Kampen, T. U.; Rossow, Uwe; Schumann, M.; Park, S.; Zahn, Dietrich R. T.
Reflectance anisotropy spectroscopy of the growth of perylene-3,4,9,10-tetracarboxylic dianhydride on chalcogen passivated GaAs(001…) surfaces. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 18 (2000), 4, S. 2077-2081
http://link.aip.org/link/doi/10.1116/1.1303740
Reflectance anisotropy spectroscopy of the growth of perylene-3,4,9,10-tetracarboxylic dianhydride on chalcogen passivated GaAs(001…) surfaces. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 18 (2000), 4, S. 2077-2081
http://link.aip.org/link/doi/10.1116/1.1303740
Rossow, Uwe; Mantese, Lucymarie; Aspnes, David E.;
Surface-induced optical anisotropy of Si and Ge. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 18 (2000), 4, S. 2229-2231
http://dx.doi.org/10.1116/1.1306309
Surface-induced optical anisotropy of Si and Ge. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 18 (2000), 4, S. 2229-2231
http://dx.doi.org/10.1116/1.1306309
Tautz, Frank Stefan; Sloboshanin, Sergej; Shklover, V.; Scholz, R.; Sokolowski, M.; Schäfer, Jürgen A.; Umbach, E.
Substrate influence on the ordering of organic submonolayers: a comparative study of PTCDA on Ag(110) and Ag(111) using HREELS. - In: Applied surface science, Bd. 166 (2000), 1/4, S. 363-369
http://dx.doi.org/10.1016/S0169-4332(00)00450-5
Substrate influence on the ordering of organic submonolayers: a comparative study of PTCDA on Ag(110) and Ag(111) using HREELS. - In: Applied surface science, Bd. 166 (2000), 1/4, S. 363-369
http://dx.doi.org/10.1016/S0169-4332(00)00450-5
Shklover, Vitaliy; Tautz, Frank Stefan; Scholz, R.; Sloboshanin, Sergej; Sokolowski, M.; Schäfer, Jürgen A.; Umbach, E.
Differences in vibronic and electronic excitations of PTCDA on Ag(1 1 1) and Ag(1 1 0). - In: Surface science, ISSN 1879-2758, Bd. 454/456 (2000), S. 60-66
http://dx.doi.org/10.1016/S0039-6028(00)00136-9
Differences in vibronic and electronic excitations of PTCDA on Ag(1 1 1) and Ag(1 1 0). - In: Surface science, ISSN 1879-2758, Bd. 454/456 (2000), S. 60-66
http://dx.doi.org/10.1016/S0039-6028(00)00136-9
Tautz, Frank Stefan; Sloboshanin, Sergej; Starke, Ulrich; Schäfer, Jürgen A.
Reassessment of core-level photoemission spectra of reconstructed SiC(0 0 0 1) surfaces. - In: Surface science, ISSN 1879-2758, Bd. 470.2000, 1/2, S. L25-L31
http://dx.doi.org/10.1016/S0039-6028(00)00841-4
Reassessment of core-level photoemission spectra of reconstructed SiC(0 0 0 1) surfaces. - In: Surface science, ISSN 1879-2758, Bd. 470.2000, 1/2, S. L25-L31
http://dx.doi.org/10.1016/S0039-6028(00)00841-4