Denner, Paul; Deutschbein, Lutz; Walter, Bernd
NMR and DSC investigations of dynamic aspects of aging in polymers. - In: Journal of macromolecular science. . - Philadelphia, Pa. : Taylor & Francis, 1967- , ISSN: 1525-609X , ZDB-ID: 2027386-1, ISSN 1525-609X, Bd. 38 (1999), 5/6, S. 1023-1035
http://dx.doi.org/10.1080/00222349908248156
NMR and DSC investigations of dynamic aspects of aging in polymers. - In: Journal of macromolecular science. . - Philadelphia, Pa. : Taylor & Francis, 1967- , ISSN: 1525-609X , ZDB-ID: 2027386-1, ISSN 1525-609X, Bd. 38 (1999), 5/6, S. 1023-1035
http://dx.doi.org/10.1080/00222349908248156
Gebhardt, R. K.; Sloboshanin, Sergej; Schäfer, Jürgen A.; Chassé, T.
Arsenic interlayers at the Sn/InP(001) interface. - In: Applied surface science, Bd. 142 (1999), 1/4, S. 94-98
http://dx.doi.org/10.1016/S0169-4332(98)00728-4
Arsenic interlayers at the Sn/InP(001) interface. - In: Applied surface science, Bd. 142 (1999), 1/4, S. 94-98
http://dx.doi.org/10.1016/S0169-4332(98)00728-4
Sloboshanin, Sergej; Engelhard, H.; Goldmann, A.; Schäfer, Jürgen A.
Interface formation of Ag and Au with InP(001)2 x 4: a photoemission study. - In: Applied surface science, Bd. 143 (1999), 1/4, S. 104-114
http://dx.doi.org/10.1016/S0169-4332(98)00898-8
Interface formation of Ag and Au with InP(001)2 x 4: a photoemission study. - In: Applied surface science, Bd. 143 (1999), 1/4, S. 104-114
http://dx.doi.org/10.1016/S0169-4332(98)00898-8
Sloboshanin, Sergej; Gebhardt, R. K.; Schäfer, Jürgen A.; Chassé, T.
Photoemission study of the interface reaction between Ag and H 2 S treated InP(0 0 1). - In: Surface science, ISSN 1879-2758, Bd. 431 (1999), 1/3, S. 252-259
http://dx.doi.org/10.1016/S0039-6028(99)00445-8
Photoemission study of the interface reaction between Ag and H 2 S treated InP(0 0 1). - In: Surface science, ISSN 1879-2758, Bd. 431 (1999), 1/3, S. 252-259
http://dx.doi.org/10.1016/S0039-6028(99)00445-8
Sloboshanin, Sergej; Tautz, Frank Stefan; Polyakov, Vladimir M.; Starke, Ulrich; Usikov, A. S.; Ber, B. Ja.; Schäfer, Jürgen A.
Structural, vibrational and electronic properties of faceted GaN (0 0 0 1) surfaces. - In: Surface science, ISSN 1879-2758, Bd. 427/428 (1999), S. 250-256
http://dx.doi.org/10.1016/S0039-6028(99)00274-5
Structural, vibrational and electronic properties of faceted GaN (0 0 0 1) surfaces. - In: Surface science, ISSN 1879-2758, Bd. 427/428 (1999), S. 250-256
http://dx.doi.org/10.1016/S0039-6028(99)00274-5
Polyakov, Vladimir M.; Balster, Torsten; Sloboshanin, Sergej; Tautz, Frank Stefan; Ibach, Harald; Schäfer, Jürgen A.
Surface state-derived electronic transitions of SiC(0 0 1). - In: Surface science, ISSN 1879-2758, Bd. 420 (1999), 1, S. 87-94
http://dx.doi.org/10.1016/S0039-6028(98)00828-0
Surface state-derived electronic transitions of SiC(0 0 1). - In: Surface science, ISSN 1879-2758, Bd. 420 (1999), 1, S. 87-94
http://dx.doi.org/10.1016/S0039-6028(98)00828-0
Polyakov, Vladimir M.; Elbe, A.; Schäfer, Jürgen A.
Post-annealing-induced free-carrier compensation in shallow-buried d layers of GaAs(1 0 0). - In: Surface science, ISSN 1879-2758, Bd. 420 (1999), 1, S. 43-52
http://dx.doi.org/10.1016/S0039-6028(98)00814-0
Post-annealing-induced free-carrier compensation in shallow-buried d layers of GaAs(1 0 0). - In: Surface science, ISSN 1879-2758, Bd. 420 (1999), 1, S. 43-52
http://dx.doi.org/10.1016/S0039-6028(98)00814-0
Scherge, Matthias; Li, X.; Schäfer, Jürgen A.
The effect of water on friction of MEMS. - In: Tribology letters, ISSN 1573-2711, Bd. 6 (1999), 3/4, S. 215-220
http://dx.doi.org/10.1023/A:1019119925494
The effect of water on friction of MEMS. - In: Tribology letters, ISSN 1573-2711, Bd. 6 (1999), 3/4, S. 215-220
http://dx.doi.org/10.1023/A:1019119925494
Scherge, Matthias; Mollenhauer, Olaf; Spiller, Frank; Schäfer, Jürgen A.
Micromechanical thin-film characterization . - In: In situ process diagnostics and modelling, (1999), S. 139-144
Micromechanical thin-film characterization . - In: In situ process diagnostics and modelling, (1999), S. 139-144
Wöhner, Thomas; Stauden, Thomas; Cimalla, Volker; Eichhorn, Gerd; Schäfer, Jürgen A.; Pezoldt, Jörg
In situ spectroscopic ellipsometry studies of the interaction process of ethene with Si surfaces during SiC formation. - In: In situ process diagnostics and modelling, (1999), S. 95-100
In situ spectroscopic ellipsometry studies of the interaction process of ethene with Si surfaces during SiC formation. - In: In situ process diagnostics and modelling, (1999), S. 95-100