Tautz, Frank Stefan; Schäfer, Jürgen A.
Ultimate resolution electron energy loss spectroscopy at H/Si(100) surfaces. - In: Journal of applied physics, ISSN 1089-7550, Bd. 84 (1998), 12, S. 6636-6643
https://doi.org/10.1063/1.369038
Ultimate resolution electron energy loss spectroscopy at H/Si(100) surfaces. - In: Journal of applied physics, ISSN 1089-7550, Bd. 84 (1998), 12, S. 6636-6643
https://doi.org/10.1063/1.369038
Scherge, Matthias; Li, X.; Schäfer, Jürgen A.
Tribologische Untersuchungen zum Einfluß von Wasser auf die Reibung von Siliziummikrobauteile. - In: Plenarvorträge, Werkstoffe und Oberflächentechnologien, Schmierstoffe und Schmierungstechnik, Minimalmengenschmierung, (1998), Vortrag 17
Tribologische Untersuchungen zum Einfluß von Wasser auf die Reibung von Siliziummikrobauteile. - In: Plenarvorträge, Werkstoffe und Oberflächentechnologien, Schmierstoffe und Schmierungstechnik, Minimalmengenschmierung, (1998), Vortrag 17
Cimalla, Volker; Stauden, Thomas; Ecke, Gernot; Scharmann, Friedhelm; Eichhorn, Gerd; Pezoldt, Jörg; Sloboshanin, Sergej; Schäfer, Jürgen A.
Initial stages in the carbonization of (111)Si by solid-source molecular beam epitaxy. - In: Applied physics letters, ISSN 1077-3118, Bd. 73 (1998), 24, S. 3542-3544
http://dx.doi.org/10.1063/1.122801
Initial stages in the carbonization of (111)Si by solid-source molecular beam epitaxy. - In: Applied physics letters, ISSN 1077-3118, Bd. 73 (1998), 24, S. 3542-3544
http://dx.doi.org/10.1063/1.122801
Mantese, Lucymarie; Bell, K. A.; Rossow, Uwe; Aspnes, David E.
Interpretation of critical point energy shifts in crystalline Si by near-surface localization of excited electronic states. - In: Thin solid films, ISSN 1879-2731, Bd. 313/314 (1998), S. 557-560
https://doi.org/10.1016/S0040-6090(97)00883-3
Interpretation of critical point energy shifts in crystalline Si by near-surface localization of excited electronic states. - In: Thin solid films, ISSN 1879-2731, Bd. 313/314 (1998), S. 557-560
https://doi.org/10.1016/S0040-6090(97)00883-3
Bell, K. A.; Mantese, Lucymarie; Rossow, Uwe; Aspnes, David E.
Systematic differences among nominal reference dielectric function spectra for crystalline Si as determined by spectroscopic ellipsometry. - In: Thin solid films, ISSN 1879-2731, Bd. 313/314 (1998), S. 161-166
https://doi.org/10.1016/S0040-6090(97)00804-3
Systematic differences among nominal reference dielectric function spectra for crystalline Si as determined by spectroscopic ellipsometry. - In: Thin solid films, ISSN 1879-2731, Bd. 313/314 (1998), S. 161-166
https://doi.org/10.1016/S0040-6090(97)00804-3
Rossow, Uwe;
Depolarization mixed polarization corrections of ellipsometry spectra. - In: Thin solid films, ISSN 1879-2731, Bd. 313/314 (1998), S. 97-101
https://doi.org/10.1016/S0040-6090(97)00777-3
Depolarization mixed polarization corrections of ellipsometry spectra. - In: Thin solid films, ISSN 1879-2731, Bd. 313/314 (1998), S. 97-101
https://doi.org/10.1016/S0040-6090(97)00777-3
Scherge, Matthias; Büchner, Hans-Joachim; Jäger, Gerd; Schäfer, Jürgen A.
Interferometric detection of adhesion-induced nano-deflections. - In: Journal of optics, ISSN 2056-7162, Bd. 29 (1998), 1, S. 23-27
http://dx.doi.org/10.1088/0150-536X/29/1/004
Interferometric detection of adhesion-induced nano-deflections. - In: Journal of optics, ISSN 2056-7162, Bd. 29 (1998), 1, S. 23-27
http://dx.doi.org/10.1088/0150-536X/29/1/004
Scherge, Matthias; Li, Xinyan; Schäfer, Jürgen A.
Nanotribological improvements due to surface chemistry modification. - In: Fundamentals of nanoindentation and nanotribology, (1998), S. 481-486
Nanotribological improvements due to surface chemistry modification. - In: Fundamentals of nanoindentation and nanotribology, (1998), S. 481-486
Aspnes, David E.; Mantese, Lucymarie; Bell, K. A.; Rossow, Uwe
Many-body and correlation effects in surface and interface spectra of optically absorbing materials. - In: Physica status solidi, ISSN 1862-6319, Bd. 170 (1998), 2, S. 199-210
http://dx.doi.org/10.1002/(SICI)1521-396X(199812)170:2<199::AID-PSSA199>3.0.CO;2-#
Many-body and correlation effects in surface and interface spectra of optically absorbing materials. - In: Physica status solidi, ISSN 1862-6319, Bd. 170 (1998), 2, S. 199-210
http://dx.doi.org/10.1002/(SICI)1521-396X(199812)170:2<199::AID-PSSA199>3.0.CO;2-#
Lübbe, Martin;
Lindner, K.; Sloboshanin, Sergej; Tautz, Frank Stefan; Schäfer, Jürgen A.; Zahn, Dietrich R. T.
Angular-resolved valence-band spectroscopy of different reconstructed 3C-SiC (001) surfaces. - In: Journal of vacuum science & technology, ISSN 1520-8559, Bd. 16 (1998), 6, S. 3471-3476
https://doi.org/10.1116/1.581505
Angular-resolved valence-band spectroscopy of different reconstructed 3C-SiC (001) surfaces. - In: Journal of vacuum science & technology, ISSN 1520-8559, Bd. 16 (1998), 6, S. 3471-3476
https://doi.org/10.1116/1.581505