Frisch, A. M.; Schultz, Ch.; Herrmann, T.; Emiliani, V.; Wolfframm, D.; Evans, D. A.; Korn, M.; Rossow, Uwe; Esser, Norbert; Richter, Wolfgang
Interpretation of reflectance anisotropy spectroscopy spectra of ZnSe(001)… grown on GaAs(001)… in terms of bulk, interface, and surface contributions. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 16 (1998), 4, S. 2350-2354
http://dx.doi.org/10.1116/1.590173
Interpretation of reflectance anisotropy spectroscopy spectra of ZnSe(001)… grown on GaAs(001)… in terms of bulk, interface, and surface contributions. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 16 (1998), 4, S. 2350-2354
http://dx.doi.org/10.1116/1.590173
Kampen, T. U.; Rossow, Uwe; Schumann, M.; Park, S.; Zahn, Dietrich R. T.
Reflectance difference spectroscopy spectra of clean (3x2), (2x1), and c(2x2) 3C-SiC(001)… surfaces: new evidence for surface state contributions to optical anisotropy spectra. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 16 (1998), 4, S. 2355-2357
http://dx.doi.org/10.1116/1.590174
Reflectance difference spectroscopy spectra of clean (3x2), (2x1), and c(2x2) 3C-SiC(001)… surfaces: new evidence for surface state contributions to optical anisotropy spectra. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 16 (1998), 4, S. 2355-2357
http://dx.doi.org/10.1116/1.590174
Aspnes, David E.; Mantese, Lucymarie; Bell, K. A.; Rossow, Uwe
Photon-induced localization and final-state correlation effects in optically absorbing materials. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 16 (1998), 4, S. 2367-2372
http://dx.doi.org/10.1116/1.590176
Photon-induced localization and final-state correlation effects in optically absorbing materials. - In: Journal of vacuum science & technology, ISSN 1520-8567, Bd. 16 (1998), 4, S. 2367-2372
http://dx.doi.org/10.1116/1.590176
Scherge, Matthias;
Schäfer, Jürgen A.; Mollenhauer, Olaf
The role of water on the micro-tribology of MEMS. - In: Micro system technologies 98, (1998), S. 630-632
The role of water on the micro-tribology of MEMS. - In: Micro system technologies 98, (1998), S. 630-632
Tautz, Frank Stefan; Sloboshanin, Sergej; Hohenecker, Stefan; Zahn, Dietrich R. T.; Schäfer, Jürgen A.
Photoelectron spectroscopy at clean and hydrogenated c(2 × 2)-SIC(100) surfaces. - In: Applied surface science, Bd. 123/124 (1998), S. 17-21
http://dx.doi.org/10.1016/S0169-4332(97)00531-X
Photoelectron spectroscopy at clean and hydrogenated c(2 × 2)-SIC(100) surfaces. - In: Applied surface science, Bd. 123/124 (1998), S. 17-21
http://dx.doi.org/10.1016/S0169-4332(97)00531-X
Rossow, Uwe; Mantese, Lucymarie; Aspnes, David E.;
Lineshapes of surface induced optical anisotropy spectra measured by RDS/RAS. - In: Applied surface science, Bd. 123/124 (1998), S. 237-242
http://dx.doi.org/10.1016/S0169-4332(97)00544-8
Lineshapes of surface induced optical anisotropy spectra measured by RDS/RAS. - In: Applied surface science, Bd. 123/124 (1998), S. 237-242
http://dx.doi.org/10.1016/S0169-4332(97)00544-8
Balster, Torsten; Polyakov, Vladimir M.; Ibach, Harald; Schäfer, Jürgen A.
A study of surface band bendings and charge densities of SiC(0 0 1) 2 × 1 and c(2 × 2) by high-resolution electron-energy-loss spectroscopy. - In: Surface science, ISSN 1879-2758, Bd. 416 (1998), 1/2, S. 177-183
http://dx.doi.org/10.1016/S0039-6028(98)00575-5
A study of surface band bendings and charge densities of SiC(0 0 1) 2 × 1 and c(2 × 2) by high-resolution electron-energy-loss spectroscopy. - In: Surface science, ISSN 1879-2758, Bd. 416 (1998), 1/2, S. 177-183
http://dx.doi.org/10.1016/S0039-6028(98)00575-5
Cole, Bryan E.; Langerak, C. J. G. M.; Murdin, B. N.; Bezant, C. D.; Chamberlain, John Martyn; Pidgeon, C. R.; Henini, Mohamed; Nakov, Valentin
Saturation absorption studies of intersubband relaxation rates in a p-GaAs/AlGaAs QW using a free electron laser. - In: Physica, ISSN 1386-9477, Bd. 2 (1998), 1/4, S. 181-185
http://dx.doi.org/10.1016/S1386-9477(98)00039-3
Saturation absorption studies of intersubband relaxation rates in a p-GaAs/AlGaAs QW using a free electron laser. - In: Physica, ISSN 1386-9477, Bd. 2 (1998), 1/4, S. 181-185
http://dx.doi.org/10.1016/S1386-9477(98)00039-3
Scherge, Matthias; Schäfer, Jürgen A.
Microtribological investigations of stick/slip phenomena using a novel oscillatory friction and adhesion tester. - In: Tribology letters, ISSN 1573-2711, Bd. 4 (1998), 1, S. 37-42
http://dx.doi.org/10.1023/A:1019182500536
Microtribological investigations of stick/slip phenomena using a novel oscillatory friction and adhesion tester. - In: Tribology letters, ISSN 1573-2711, Bd. 4 (1998), 1, S. 37-42
http://dx.doi.org/10.1023/A:1019182500536
Klotzbücher, T.; Scherge, Matthias; Mergens, M.; Wesner, D. A.; Kreutz, E. W.
Deposition of carbon nitride thin films in a hybrid r.f.-PLD technique. - In: Surface and coatings technology, ISSN 1879-3347, Bd. 98 (1998), 1/3, S. 1072-1078
https://doi.org/10.1016/S0257-8972(97)00286-7
Deposition of carbon nitride thin films in a hybrid r.f.-PLD technique. - In: Surface and coatings technology, ISSN 1879-3347, Bd. 98 (1998), 1/3, S. 1072-1078
https://doi.org/10.1016/S0257-8972(97)00286-7