Pezoldt, Jörg; Zgheib, Charbel; Masri, Pierre; Averous, Michel; Morales, Francisco M.; Kosiba, Rastislav; Ecke, Gernot; Weih, Petia; Ambacher, Oliver
SIMS investigation of the influence of Ge pre-deposition on the interface quality between SiC and Si. - In: Surface and interface analysis, ISSN 0142-2421, Bd. 36 (2004), 8, S. 969-972
SIMS investigation of the influence of Ge pre-deposition on the interface quality between SiC and Si. - In: Surface and interface analysis, ISSN 0142-2421, Bd. 36 (2004), 8, S. 969-972
Bechstedt, Friedhelm; Furthmüller, Jürgen; Ferhat, M.; Teles, L. K.; Scolfaro, L. M. R.; Leite, J. R.; Davydov, Valery Yu.; Ambacher, Oliver; Goldhahn, Rüdiger
Energy gap and optical properties of In x Ga 1-x N. - In: Physica status solidi, ISSN 1862-6319, Bd. 195 (2003), 3, S. 628-633
http://dx.doi.org/10.1002/pssa.200306164
Energy gap and optical properties of In x Ga 1-x N. - In: Physica status solidi, ISSN 1862-6319, Bd. 195 (2003), 3, S. 628-633
http://dx.doi.org/10.1002/pssa.200306164
Morales, Francisco M.; Molina, Sergio I.; Araújo, Daniel; Cimalla, Volker; Pezoldt, Jörg; Barbadillo, L.; Hernández, M. J.; Piqueras, Javier
Transmission electron microscopy study of ultra-thin SiC layers obtained by rapid thermal carbonization of Si wafers. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 195 (2003), 1, S. 116-121
http://dx.doi.org/10.1002/pssa.200306278
Transmission electron microscopy study of ultra-thin SiC layers obtained by rapid thermal carbonization of Si wafers. - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 195 (2003), 1, S. 116-121
http://dx.doi.org/10.1002/pssa.200306278
Winzer, Andreas T.; Goldhahn, Rüdiger; Buchheim, Carsten; Ambacher, Oliver; Link, Angela; Stutzmann, Martin; Smorchkova, Y.; Mishra, Umesh K.; Speck, James S.
Photoreflectance studies of N- and Ga-face AlGaN/GaN heterostructures confining a polarisation induced 2DEG. - In: Physica status solidi, ISSN 1521-3951, Bd. 240 (2003), 2, S. 380-383
http://dx.doi.org/10.1002/pssb.200303351
Photoreflectance studies of N- and Ga-face AlGaN/GaN heterostructures confining a polarisation induced 2DEG. - In: Physica status solidi, ISSN 1521-3951, Bd. 240 (2003), 2, S. 380-383
http://dx.doi.org/10.1002/pssb.200303351
Sensfuss, Steffi; Konkin, Alexander; Roth, Hans-Klaus; Ibrahim, Maher al-; Zhokhavets, Uladzimir; Gobsch, Gerhard; Krinichnyi, V. I.; Nazmutdinova, Gulnara A.; Klemm, Elisabeth
Optical and ESR studies on poly(3-alkylthiophene)/fullerene composites for solar cells. - In: Synthetic metals, Bd. 137 (2003), 1/3, S. 1433-1434
http://dx.doi.org/10.1016/S0379-6779(02)01167-0
Optical and ESR studies on poly(3-alkylthiophene)/fullerene composites for solar cells. - In: Synthetic metals, Bd. 137 (2003), 1/3, S. 1433-1434
http://dx.doi.org/10.1016/S0379-6779(02)01167-0
Liebold, Ulrich
Verbundprojekt ZULES : Schlussbericht zum Teilvorhaben der TU Ilmenau ; Fachgebiet Festkörperelektronik ; Projektzeitraum: 01.01.2000 - 30.06.2003 ; Förderschwerpunkt "Mikrosystemtechnik 2000+" des Bundesministeriums für Bildung und Forschung. - Ilmenau. - 73 Bl.Förderkennzeichen BMBF 16 SV 1183/4. - Verbund-Nr. 01017713. - Engl. Zsfassung u.d.T.: ZULES - Final report subproject of Technische Universität Ilmenau. - Literaturverz. Bl. 73
https://edocs.tib.eu/files/e01fbdig09/595781071.pdf
Verbundprojekt ZULES : Schlussbericht zum Teilvorhaben der TU Ilmenau ; Fachgebiet Festkörperelektronik ; Projektzeitraum: 01.01.2000 - 30.06.2003 ; Förderschwerpunkt "Mikrosystemtechnik 2000+" des Bundesministeriums für Bildung und Forschung. - Ilmenau. - 73 Bl.Förderkennzeichen BMBF 16 SV 1183/4. - Verbund-Nr. 01017713. - Engl. Zsfassung u.d.T.: ZULES - Final report subproject of Technische Universität Ilmenau. - Literaturverz. Bl. 73
https://edocs.tib.eu/files/e01fbdig09/595781071.pdf
Drakopoulos, M.; Zegenhagen, J.; Lee, T.-L.; Snigirev, A.; Snigireva, I.; Cimalla, Volker; Ambacher, Oliver
GaN polarity domains spatially resolved by x-ray standing wave microscopy. - In: Journal of physics, ISSN 1361-6463, Bd. 36 (2003), 10A, S. A214-A216
https://doi.org/10.1088/0022-3727/36/10A/344
GaN polarity domains spatially resolved by x-ray standing wave microscopy. - In: Journal of physics, ISSN 1361-6463, Bd. 36 (2003), 10A, S. A214-A216
https://doi.org/10.1088/0022-3727/36/10A/344
Schwierz, Frank; Ambacher, Oliver
Recent advances in GaN HEMT development. - In: EDMO 2003, (2003), S. 204-209
Recent advances in GaN HEMT development. - In: EDMO 2003, (2003), S. 204-209
Spieß, Lothar; Gubisch, Maik; Romanus, Henry; Breiter, Manuela; Müller, Ch.; Cimalla, Volker; Ecke, Gernot; Liu, Yonghe; Knedlik, Christian
Tungsten carbide layers for nanomeasuring systems. - In: Proceedings, (2003), S. 165-170
Tungsten carbide layers for nanomeasuring systems. - In: Proceedings, (2003), S. 165-170
Bender, Marcus; Fortunato, Elvira; Nunes, Patricia; Ferreira, Isabel; Marques, António; Martins, Rodrigo; Katsarakis, Nikos; Cimalla, Volker; Kiriakidis, George
Highly sensitive ZnO ozone detectors at room temperature. - In: Japanese journal of applied physics, ISSN 1347-4065, Bd. 42.2003, Pt. 2, 4B, S. L435-L437
http://dx.doi.org/10.1143/JJAP.42.L435
Highly sensitive ZnO ozone detectors at room temperature. - In: Japanese journal of applied physics, ISSN 1347-4065, Bd. 42.2003, Pt. 2, 4B, S. L435-L437
http://dx.doi.org/10.1143/JJAP.42.L435