Tagungsbeiträge

Anzahl der Treffer: 2032
Erstellt: Tue, 02 Jul 2024 23:04:53 +0200 in 0.0985 sec


Schilling, Cornelius; Müller, Ralf; Kempf, Wolfgang; Stubenrauch, Mike; Witte, Hartmut
Ein netzbasiertes Lehr- und Informationssystem zur ökologischen, toxikologischen und medizintechnischen Relevanz chemischer Elemente für Techniker und Ingenieurstudenten. - In: Macro and trace elements, (2004), S. 525-531

Förster, Christian; Schnabel, F.; Weih, Petia; Stauden, Thomas; Ambacher, Oliver; Pezoldt, Jörg
In situ spectroscopic ellipsometry of hydrogen-argon plasma cleaned silicon surfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 455/456 (2004), S. 695-699

https://doi.org/10.1016/j.tsf.2003.11.255
Zgheib, Charbel; Förster, Christian; Weih, Petia; Cimalla, Volker; Kazan, Michel; Masri, Pierre; Ambacher, Oliver; Pezoldt, Jörg
Infrared ellipsometry of SiC/Si heterostructures with Ge modified interfaces. - In: Thin solid films, ISSN 1879-2731, Bd. 455/456 (2004), S. 183-186

https://doi.org/10.1016/j.tsf.2003.11.208
Hotovy, Ivan; Huran, Jozef; Spieß, Lothar; Gubisch, Maik; Schawohl, Jens
NiO modified thin films for gas monitoring. - In: The Fifth International Conference on Advanced Semiconductor Devices and Microsystems, 2004, (2004), S. 303-306

http://dx.doi.org/10.1109/ASDAM.2004.1441221
Perrone, Rubén; Thust, Heiko; Drüe, Karl-Heinz
Progress in the integration of planar and 3D coils on LTCC by using photoimageable inks. - In: IMAPS 2004, (2004), insges. 4 S.

Shokhovets, Sviatoslav; Fuhrmann, Daniel; Goldhahn, Rüdiger; Gobsch, Gerhard; Ambacher, Oliver; Hermann, Martin; Eickhoff, Martin
Temperature-dependent electric fields in GaN Schottky diodes studied by electroreflectance. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 163-166

http://dx.doi.org/10.1016/j.tsf.2003.10.064
Buchheim, Carsten; Winzer, Andreas T.; Goldhahn, Rüdiger; Gobsch, Gerhard; Ambacher, Oliver; Link, Angela; Eickhoff, Martin; Stutzmann, Martin
Photoreflectance studies of (Al)Ga- and N-face AlGaN/GaN heterostructures. - In: Thin solid films, ISSN 1879-2731, Bd. 450 (2004), 1, S. 155-158

http://dx.doi.org/10.1016/j.tsf.2003.10.062
Schmidt, Alexander A.; Safonov, K. L.; Trushin, Yuri V.; Cimalla, Volker; Ambacher, Oliver; Pezoldt, Jörg
Kinetic Monte Carlo simulation of SiC nucleation on Si(111). - In: Physica status solidi. Applications and materials science. - Weinheim : Wiley-VCH, 2005- , ISSN: 1862-6319 , ZDB-ID: 1481091-8, ISSN 1862-6319, Bd. 201 (2004), 2, S. 333-337

http://dx.doi.org/10.1002/pssa.200303962
Arndt, Christian; Zhokhavets, Uladzimir; Mohr, Martina; Gobsch, Gerhard; Al-Ibrahim, Maher; Sensfuss, Steffi
Determination of polaron lifetime and mobility in a polymer/fullerene solar cell by means of photoinduced absorption. - In: Synthetic metals, Bd. 147 (2004), 1/3, S. 257-260

http://dx.doi.org/10.1016/j.synthmet.2004.06.037
Hotovy, Ivan; Huran, Jozef; Siciliano, Pietro; Capone, Simonetta; Spieß, Lothar; Rehacek, Vlastimil
Enhancement of H2 sensing properties of NiO-based thin films with a Pt surface modification. - In: Sensors and actuators, ISSN 0925-4005, Bd. 103 (2004), 1/2, S. 300-311

http://dx.doi.org/10.1016/j.snb.2004.04.109